Fluke 900 User Manual
Fluke 900 service manual
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FLUKE 900
SERVICE MANUAL
NOTE:
This manual documents FLUKE900 instruments S/N 4720000 and above.
It also documents any FLUKE 900 vnth the Simulation Option (900-001) installed.
Print Date: September 1992
MN-0004
FLUKE P/N 889691
(c) Copyright 1992
All rights reserved
ZTEST Electronics Inc.
1305 Matheson Blvd.
Mississauga, Ontario
Canada L4W1R1
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Table of contents
Document Outline
- Table of Contents
- 1 Service Manual Introduction
- 1.1 Description of Operator, Service Manuals
- 1.2 Basic Operation of Keyboard and Display
- 2 Theory of Operation
- 2.1 General
- 2.2 Interface Buffer
- 2.3 Micro Board
- 2.4 High Speed Board
- 2.5 Test Clips
- 3 Selftest
- 3.1 Reading Selftest Results
- 3.1.1 General Selftest Results
- 3.1.3 Chip Size LED Error Codes
- 3.2 Running and Reading Individual Selftests
- 3.3 Individual Selftest Descriptions
- TEST 0 SLFT_CLIP
- TESTS 1 2
- PULLO_MON, PULL1_MON
- TESTS 3,4
- PULL0_FLT, PULL1_FLT
- TESTS 5,6
- SYNCO_Hres_FLT, SYNCl_Hres_FLT
- TESTS 7 8
- SYNC0_Lres_FLT, SYNC1_Lres_FLT
- TESTS 9,10
- PINDISO_FLT, PINDIS1_FLT
- TESTS 11,12
- SLFTSTO_FLT, SLFTST1_FLT
- TESTS 13,14 VccON_FLT, GndON_FLT
- TEST 15 PULLPOS_FREQ
- TESTS 16,17
- TRIGQALO_EQUAL, TRIGQAL1_EQUAL
- TESTS 18,19
- QAL0_EQUAL, QAL1_EQUAL
- TRIGO_EQUAL, TRIG1_EQUAL
- TESTS 22 23
- PULLO_TRIG_EQUAL, PULL1_TRIG_EQUAL
- TESTS 25,26
- FM_STAT_NFLT, FM_STAT_FLT
- TEST 27
- FMASK_WB_TEST
- TEST 28 FMASK_CAL
- TESTS 29,31,33,35,37,39 FMxx_FLT
- TESTS 30,32,34,36,38,40 FMxx_NFLT
- TEST 41 ACT_DIS_CLR
- TESTS 42 43
- PULLO_ACT_TSTON, PULL1_ACT_TSTON
- TESTS 44, 45
- PULLO_ACT_ACTSTR, PULL1_ACT_ACTSTR
- TESTS 46,47
- Interface Buffer shift register subtest
- Frequency HW subtest
- Threshold HW subtest
- Reset HW subtest
- Result bytes:
- TEST 48
- KEYBOARD_OPEN
- TEST 49 TEST_CYCLE
- TEST 50 UART_TEST
- TEST 51 DGATE_TEST
- TEST 52 PULL0_XTRIG
- TEST 53 PULL1_XTRIG
- TEST 54 PULL_XEVENT
- TEST 55 SHADJNIT
- TEST E60 WALK_SIZELEDS
- TEST E61 TEST_MEMORY
- TEST E62 WALK_MONLEDS
- TEST E63 UPDATE_VCC_LIM
- TEST E64 SHAD_ADDR
- TEST E70 KEY_CLOSURE
- TEST E71 DISP_RAM
- TEST E74 DISP_CHAR_SET
- TEST E75 CART_SLFT
- TEST E76 TEST_C_ENG
- TEST E77 ACT_CROSS
- TEST E78 TRG_CROSS
- TEST E79 FRQ_CROSS
- TEST E80 FLT_CROSS
- 3.4 System Error Codes
- 4 Troubleshooting
- 4.1 Test Result Interpretation
- 4.2 Selftest / Circuit Block Reference Table
- 4.3 Selftest Circuit Block Diagrams
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- 4.4.2 Static-blown HSB
- 4.4.3 Missing -5 V
- 5.3.2 Keyboard
- 5.3.3 Speaker
- 5.3.4 Display Controller
- 5.3.5 Display
- 5.3.6 High Speed Board
- 5.3.7 Power Supply
- 5.3.7.1 Fan
- 5.3.8 Interface Buffer Board
- 5.4 Calibration Procedures
- 5.4.1 Interface Buffer Calibration
- 5.4.2 High Speed Board Calibration
- 5.4.2.1 Calibration Data Format
- S.4.2.4 The Offset Shift (OS) Definition
- 5.4.2.4.1 Example 1 (for negative offsets)
- 5.4.2A.2 Example 2 (for positive offsets)
- 5.4.2.5 The Correcting Component Definition
- S.4.2.6 Calibration Procedure
- 5.4.2.6.1 Offsets Block
- 5.4.2.6.2 Limits Block
- 5.4.2.6.3 Selftest buffer and 86 gate related condition
- 5.4.2.6.4 LM360 comparator related condition
- 5.5 Board Revisions, Upgrades and ECOs
- 5.5.1 Modification to MB for 64k Cartridges
- 5.5.2 900 System Firmware
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