INFICON IQM-233 Thin Film Deposition Controller PCI-Express Card Codeposition Software Operating Manual - Manual (Page 63)

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IQS-233 Operating Manual
New . . . . . . . . . . . . . . . . . . . Displays the New Material Name window where a
name for a new material can be entered and saved
to the Material library. To display the new material
name, select the new name from the Material library
list. The Density and Z-Ratio values for that material
can then be edited and saved under the new name.
Figure 2-35 New Material Name window
Delete . . . . . . . . . . . . . . . . . Deletes the currently displayed material name from
the material library.
CAUTION
Delete cannot be undone.
Factory Default . . . . . . . . . Restores the Material Name, Density, and Z-Ratio
values to the factory default values for all Materials.
CAUTION
Any custom changes or added materials will be lost.
Density (g/cm 3 ) . . . . . . . . . . 0.40 to 99.99 g/cm 3
The density of the material to be deposited (see
Appendix A, Material Table ). The Density value has
a significant effect on the measured Thickness.
Z-Ratio . . . . . . . . . . . . . . . . . 0.100 to 9.999
A value specific to the material being deposited that
compensates for the mechanical elasticity of the
material to the quartz crystal (see
Appendix A,
Material Table ). The Z-Ratio has a minimal effect on
the measured Thickness when the crystal is new and
a greater effect on Thickness as the deposited
coating on the crystal becomes thicker.