Figure 17-8. clock timing measurement at xtin, Table 17-11. sub oscillation stabilization time – Samsung S3C8275X User Manual

Page 307

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ELECTRICAL DATA

S3C8275X/F8275X/C8278X/F8278X/C8274X/F8274X

17-12

Table 17-11. Sub Oscillation Stabilization Time

(T

A

=

− 25

°

C to + 85

°

C, V

DD

= 2.0 V to 3.6 V)

Oscillator Test

Condition

Min

Typ

Max

Unit

Crystal –

10 s

External clock

XT

IN

input high and low width (t

XH

, t

XL

)

5

15

µs

t

XTH

t

XTL

V

DD

-0.1 V

0.1 V

XT

IN

1/fxt

Figure 17-8. Clock Timing Measurement at XT

IN

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