5 program and erase characteristics, Input test waveforms and measurement levels, Output test load – Rainbow Electronics AT45DB642 User Manual
Page 49
49
AT45DB321E [PRELIMINARY DATASHEET]
8784B–DFLASH–11/2012
18.5 Program and Erase Characteristics
Notes: 1. Values are based on device characterization, not 100% tested in production.
2. Not 100% tested (value guaranteed by design and characterization).
19.
Input Test Waveforms and Measurement Levels
20.
Output Test Load
Symbol
Parameter
Min
Typ
Max
Units
t
EP
Page Erase and Programming Time (512/528 bytes)
17
50
ms
t
P
Page Programming Time
3
6
ms
t
BP
Byte Programming Time
8
μs
t
PE
Page Erase Time
15
50
ms
t
BE
Block Erase Time
45
100
ms
t
SE
Sector Erase Time
0.7
1
s
t
CE
Chip Erase Time
60
80
s
t
SUSP
Suspend Time
Program
10
20
μs
Erase
20
40
t
RES
Resume Time
Program
10
20
μs
Erase
20
40
t
OTPP
OTP Security Register Program Time
200
500
μs
AC
Driving
Levels
AC
Measurement
Level
0.1V
CC
V
CC
/2
0.9V
CC
t
R
, t
F
< 2ns (10% to 90%)
Device
Under
Test
30pF