Ac read characteristics, Ac read waveforms(1)(2)(3)(4), Input test waveforms and measurement level – Rainbow Electronics AT28C256 User Manual

Page 5: Output test load, Pin capacitance, Ac read waveform s

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AT28C256

5

AC Read Waveforms

(1)(2)(3)(4)

Notes:

1. CE may be delayed up to t

ACC

- t

CE

after the address transition without impact on t

ACC

.

2. OE may be delayed up to t

CE

- t

OE

after the falling edge of CE without impact on t

CE

or by t

ACC

- t

OE

after an address change

without impact on t

ACC

.

3. t

DF

is specified from OE or CE whichever occurs first (C

L

= 5 pF).

4. This parameter is characterized and is not 100% tested.

Input Test Waveforms and
Measurement Level

Output Test Load

Note:

1. This parameter is characterized and is not 100% tested.

AC Read Characteristics

Symbol

Parameter

AT28C256-15

AT28C256-20

AT28C256-25

AT28C256-35

Units

Min

Max

Min

Max

Min

Max

Min

Max

t

ACC

Address to Output Delay

150

200

250

350

ns

t

CE

(1)

CE to Output Delay

150

200

250

350

ns

t

OE

(2)

OE to Output Delay

0

70

0

80

0

100

0

100

ns

t

DF

(3)(4)

CE or OE to Output Float

0

50

0

55

0

60

0

70

ns

t

OH

Output Hold from OE, CE or
Address, whichever occurred first

0

0

0

0

ns

t

R

, t

F

< 5 ns

Pin Capacitance

f = 1 MHz, T = 25°C

(1)

Symbol

Typ

Max

Units

Conditions

C

IN

4

6

pF

V

IN

= 0V

C

OUT

8

12

pF

V

OUT

= 0V

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