Ocean Optics NanoCalc Software - Manual

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Functionality, connectivity and performance drive NanoCalc software for thin
film metrology. The streamlined NanoCalc interface makes data presentation
and analysis more visual. Convenience features like user-defined measurement
routines make measuring film thickness and n, k, EMA functions and many other
layer parameters straightforward. Fast Fourier Transform (FFT) algorithms and
simulations that allow you to model systems up to 10 layers thick make NanoCalc
a must-have for your thin film metrology applications.
NanoCalc Software
Analysis Software for Thin Film Metrology