Atec Anritsu-68369ANV - Manual (Page 7)

IN EVERY APPLICATION
Perfect for Component Test
The 68100C series are your ideal component test signal
sources. Analyze key communications, electronic warfare
and RADAR components at baseband, IF and carrier
frequencies to 65 GHz. Analyze extremely high-Q
components with the optional 0.1 Hz frequency resolution.
Step sweep mode delivers synthesized frequency
accuracy, or choose analog sweep for the fastest possible
sweep times.
With <–60 dBc specified spurious levels, network
analysis and power measurement errors are eliminated.
Compression measurements are simple with the 0.01 dB
resolution available in power sweep mode.
Sophisticated master/slave capability permits two
synthesizers to sweep synchronously for mixer or
frequency converter measurements. Up, down,
harmonically related, and many other inter-dependent
sweeps can be configured with the digitally-controlled
master/slave capability.
5
Superior Signal Simulation
Aids Receiver Testing
AM, FM, phase modulation, pulse modulation, scan modulation
and user-defined modulation make the Anritsu 69300B series
perfect for signal simulation.
Internal modulation generators offer 7 modulating waveforms
plus optional user-defined modulation waveforms. Internal
Gaussian and uniform noise capabilities provide controlled
clock jitter for digital receiver testing.
Advanced internal pulse modulation generates single and
multiple pulses, for the ultimate in radar blind spot and
recovery time testing. In addition, Anritsu’s unique pulse
generator provides moving target simulation, radar and
fading simulation.
User-defined modulation capability enables generation
of custom modulated waveforms. Two internal arbitrary
waveform generators simulate ASK, PSK, or FSK
waveforms as well as antenna scan patterns, IFF
patterns and TACAN waveforms without the need for
external modulation sources.