Atec Gantner-Q-brixx User Manual

Q. brixx gate, Base unit with test controller, Key features

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Q.

brixx gate

Base Unit with Test Controller

Gantner Instruments Incorporated

www.gantnerinstruments.com

[email protected]

9835 Carroll Centre Road, Suite 100 Toll Free: (877) 725-6997 (877 QBLOXXS)

Toll Free Fax: (800) 303-9381

San Diego, CA 92126 USA

Direct: (858) 537-2060

Direct Fax: (858) 537-2064
















































Key Features:

Q.brixx base unit

consists of side handles, Test Controller Q.brixx gate and
power supply unit, ready for 16 measurement modules

Flexibility at high density

up to 16 modules in one system with a individual compilation,
various input plugs available

Robust and reliable

stable and compact aluminum housing, easy to carry

electromagnetic compatibility

according EN 61000-4 and EN 55011

Temperature range -20 up to +60°C

power supply 10 up to 30 VDC

Synchronization and time stamp of measurement values

IRIG based master slave principle on RS485 standard
DCF77, AFNOR etc, GPS time and position data
SNTP over Ethernet

Ethernet interface for configuration and data output

FTP, TCP/IP, UDP

FTP Server and FTP Client functionality

configurable function

High data rate over Ethernet

128 real variables with 1 kHz (block transfer)
16 real variables with 10 kHz (block transfer)
64 real variables with 300 Hz (online)

Data buffer memory 16 MByte

Data buffer at block transfer of measurements,
different logger possibilities, extendable by USB device

PAC functionality

Sequences, data logger, PID-controller, transfer functions,
mathematic, numeric, Boolean combinations, functions generator

The Q.brixx series takes the performance of the Q.bloxx

modules and delivers them in an integrated, rugged,

scalable, and portable form factor. More than a dozen I/O

modules types are available allowing you to ‘mix and

match’ measurement features with your application

requirements. Each Q.brixx module is individually housed

in a rugged aluminum housing that handles data

acquisition (up to 100 kHz per channel), channel-to-

channel isolation (up to 1200 VDC), sensor conditioning,

filtering, linearization, and conversion to engineering units

– all at the I/O measurement level. The integrated Q.gate

test controller handles the data synchronization, buffering,

time stamping, and communication to the automation

system or PC over Ethernet (TCP, UDP, FTP Modbus,

etc.). The overall result is a portable measurement system

that’s up to the test.

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