Hfp series active probes, Unique probe tips, Convenient grounding accessories – Atec LeCroy-HFP Series User Manual

Page 2: Easy-to-use

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HFP Series Active Probes

Unique Probe Tips

Since different situations call for

probing at different points, the

HFP Series includes 5 different

types of probe tips. The Straight Tip

is ideal for general purpose browsing,

and the Sharp Tip or Bent Sharp Tip

can be used for easy access to tightly

spaced test points or circuit vias. Use

the Discrete SMD Tip for probing on

surface mount capacitors, resistors,

or other components. The IC Lead Tip

enables probing on small geometry

IC legs and is insulated to prevent

any shorting between the test points.

In addition to these unique probe

tips, traditional IC clips and flexible

wire leads are also included.

Convenient Grounding
Accessories

Just as important as getting access

to critical test points is the ability

to easily ground the probe. It is ideal

to keep the ground loop as small

as possible to eliminate any ground

effects on the signal. The HFP Series

includes several grounding accessories

to simplify the process. Wedge the

flexible IC Ground Blade between

two legs of an IC for a solid ground

contact without risking a short. Use

the Bendable Pogo Ground to probe

a test point and ground that are

extremely close together, as with a

BGA. The Ground Spring can be used

to easily connect to a square pin that

is next to the test point.

Easy-To-Use

In many cases it is important to

have up to 4 probes connected to

tightly packed test points in your

circuit. For this, take advantage

of the unique FreeHand probe holder,

which allows you to set up all the

probes once, and keeps your hands

free to make measurements on the

oscilloscope. Easily identify which

probe is for which channel by looking

at the patented AutoColor ID feature.

All probes light up with an LED

color matched to the channel it is

being used on.

Hands free probing.

2

Engineers often find the need

to probe a variety of different

devices and test points in

their designs. In order to do

this, today’s probes need to

be versatile, small, and

lightweight while maintaining

the necessary bandwidth to

capture high-speed signals. As

probing points get smaller and

closer together, LeCroy’s HFP

Series of active probes provide

the ability to meet all of your

difficult probing challenges.

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