Atec Wilcom-D400 User Manual

Wilcom, Digital test system

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D400/D450

Wilcom

Features

Flash PROMs Allow New

Software Downloads via
Dial-up Connection — no
more PROM replacement

Expandable Architecture —

Built-in expansion slots

Advanced User Interface

featuring a 4-line, 160
Character Backlit
Supertwist Display

Speaker Output — Voice

conversation monitored
simultaneously in both
directions

History file permits multiple

storage of measured events

digital test system

Description

If you’ve been waiting for the perfect digital test set, then wait
no longer! The Wilcom D400 Digital Test System ushers in a
new era in transmission testing. By providing a complete set of
T1 Test functions today while looking ahead to your testing
needs of tomorrow the D400 removes one major drawback
found in other test sets — obsolescence.

Rest easy knowing you can purchase only those test functions
that are required immediately. Then as your testing needs grow,
simply purchase the option cards and software packages that
meet your new demands. Installation is easy, performed by you
or through our

factory. To make installation of option software

as simple as possible, the D400 includes Flash PROMS. Using
Flash PROMS allows downloading of new system software by
dial-up modem connection. Therefore, physically changing
the PROMS is no longer a concern. In a world of ever changing
technology, the D400 is definitely a safe investment.

The D400 Digital Test System is designed with expansion in
mind. Its rugged chassis can accommodate a wide selection of
option cards (e.g. BERT testing, DS3 Drop & Insert, DTMF/
MF signaling, DDS & Factional T1, FDL Access, SLC-96
Derived Data Link access) and two processor enhancements
(e.g. memory expansion, internal dial-up modem). Back panel
connection plates provide the capability to add any type of
future connector — including 75

coaxial, RS-232C, and

fiber optic. The 75 watt power supply has enough muscle to
support all currently available and future option cards, and the
Intel 80188-based processor has memory and capacity to spare.

The D400 Digital Test System is available in two versions: a
bench test set version, the D400 with five expansion slots and
a field test set version, the D450 with two expansion slots. Both
base units are complete in-service T1 test sets. Their full-
duplex drop and insert capabilities allow simultaneous channel
testing in both directions. The two channel tone synthesizers
and receivers provide noise and frequency measurements from
0 to 3990 Hz. Bit patterns can be sent and displayed in both
directions simultaneously. The A/B/C/D signaling bits of all 24
channels can be scanned and displayed on screen. Loop timing
and frame slip counting is performed. Plus all the performance
monitoring features are included so tariffed service require-
ments can be checked and verified. This makes the D400 and
D450 base units complete DS1 test sets unto themselves.

Several optional accessories are available, including the D555
Non-Intrusive Probe used for testing T1 anywhere on twisted
pair, a thermal printer, and a padded carrying case. Shipped with
every unit is a comprehensive manual and the D400 EZ Test
Index, a quick step-by-step guide to test setup.

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