Atec TektronixCSA7404 User Manual

Page 2

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Digital Phosphor Oscilloscopes

www.tektronix.com/csa7000

2

Communication Signal Analyzers

CSA7000 Series

Clock Recovery

CSA7000 Series analyzers include clock

recovery for electrical and optical serial data

streams from 1.5 MBaud to 2.5 GBaud.

Users can easily and reliably perform mask

testing and parametric analysis with a single

connection. Recovered clock and data signals

are available on the front panel for connection

to other equipment, such as a BER analyzer.

Serial Pattern Trigger

The CSA7000 Series includes hardware-

based serial pattern trigger to isolate data

patterns. Serial trigger provides a direct

means to analyze pattern dependent issues,

even on a single-shot basis. The combination

of serial trigger and signal averaging reduces

random noise, enhancing acquisition of low

power signals. Users can specify patterns

with up to 32 bits, including “don’t-care”

bits. The serial trigger system can be clocked

from an external source or internal clock

recovery can be applied, providing single-

connection convenience.

Unprecedented
Simplicity

Integrated Optical
Reference Receiver

Compliance testing for optical standards

requires calibrated optical reference receiver

response. CSA7000 Series models include

a broad wavelength optical input enabling

them to conveniently address a wide range

of standards. A complete library of optical

reference receiver filters ensures versatility

and eliminates the need for reconfiguring

external modules or plug-ins. Filters can

easily be disabled to provide full-bandwidth

analysis on optical signals. The CSA7404

includes reference receiver filters implementing

fourth-order Bessel-Thompson response for

the following standards and bit rates:

SONET/SDH

OC-48/STM16 FEC, OC-48/STM16,

OC-12/STM4, OC-3/STM1, OC-1/STM0

VSR (1.24416 Gbps)

Fibre Channel 2125, 1063, 531, 266, 133

Gigabit Ethernet

InfiniBand 2.5 Gbps

IEEE 1394b S1600, S800, S400

The integrated O/E architecture of the

CSA7000 Series provides a robust, fully

calibrated signal path and eliminates the

need to match an external O/E adapter to a

specific instrument. The real-time architecture

of the CSA7000 Series is quickly user-

configurable with an optical channel and

three electrical inputs or with four electrical

inputs. The output of the O/E is available

on the front panel for use with other

instrumentation.

Mask Testing

The CSA7000 Series provides a complete

portfolio of masks for verifying compliance

to optical and electrical standards. Engineers

can verify circuit design performance and

perform interface compliance testing with

one real-time instrument, even when devel-

oping multi-standard and multi-rate designs.

Standard masks include:

SONET/SDH GR 253-Core (51.4 Mbps

to 2.666 Gbps)

Ethernet IEEE Std 802.3, ANSI X3.263

(125 Mbps to 1.25 Gbps)

Fibre Channel ANSI X3.230 (132.8 Mbps

to 2.125 Gbps)

Fibre Channel Electrical (132.8 Mbps

to 2.125 Gbps)

InfiniBand (2.5 Gbps)

ITU-T G.703 (1.544 Mbps to 155.52 Mbps)

ANSI T1.102 (1.544 Mbps to 155.52 Mbps)

USB (12 Mbps, 480 Mbps)

Serial ATA (1.5 Gbps)

IEEE 1394b (393 Mbps to 1.5729 Gbps)

PCI Express (2.5 Gbps)

Rapid I/O (500 Mbps to 2 Gbps)

SPI-5 (2.488 Gbps)

SFI-5 (2.488 Gbps)

TFI-5 (2.488 Gbps)

VSR (1.24416 Gbps)

Several powerful features allow users to easily

tailor mask testing for specific requirements:

One-button Autoset matches instrument

settings to signal characteristics and
specific mask requirements

Optional Auto-Fit process optimizes signal

position within the mask to minimize hits

Mask Margin control adjusts tolerance

during testing

Hit-counting identifies location and degree

of failures

Optional test-related actions including

notification, logging and hardcopy

Built-in mask editing allowing users to

copy and adjust mask values from
a standard, or create new masks

Mask testing results are reported live, providing

real-time feedback. Mask hits are highlighted

on the display and accompanied by readouts

indicating waveforms tested, pass/fail results

and hit counts. A log file summarizing test

results can also be generated automatically.

Users can take advantage of the open Windows

platform to quickly copy and paste test result

screen images or log file information into

reports created with WordPad or other

applications on the instrument.

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