Atec Teseq-NSG_5071 - Manual

A d v a n c e d Te s t S o l u t i o n s f o r E M C
The NSG 5071 is designed exactly in accordance with EMC-CS-2009.1 for test CI 220 pulses A1, A2-1, A2-2,
C1, C2 and RI 130 using an inductive/relay transient generator test circuit. The NSG 5071 also features
the CI 260 Waveform F in this test circuit which uses the same type of relay. This test circuit is defi ned
in annex F for the A, C pulses and RI 130 and fi gure 19-10 for CI 260 Waveform F.
The basic philosophy of this test circuit is better reproducibility of actual switching transients. The repro-
ducibility of this test circuit comes not from the output characteristics as in traditional conducted auto-
motive immunity tests, but from a fi xed design of the generator using several pre-defi ned components.
Many of these components are defi ned in the standard as “critical” with no substitutions allowed. These
components are used as required in the standard.
The test circuit is based primarily around a Potter and Brumfi eld relay and two inductors from Osborne
Transformer. The relay is used in three ways: to switch the voltage off to inductors thus causing large
inductive kickback transients, to self-chatter, and in the case of Waveform F, to act as a randomized
dropout test.
The NSG 5071 is a convenient way of using the required components in the different required confi gura-
tions in the standard to provide a single output to the EUT and maximize ease-of-use.
Designed in accordance to Ford
standard EMC-CS-2009
Transients disturbances CI 220 A
and C pulses
CI 260 waveform F
User replaceable relays
Timer to track relay usage
Up to 30 A DUT current
INDUCTIVE SWITCH TRANSIENT TEST CIRCUIT
NSG 5071
Critical components used: Potter and Brumfi eld KUP-14A15-12
5 μH Osborn Transformer PN 8745
100 mH Osborn Transformer PN 32416
DC current (I
max
): 10 A with supplied relay
Up to 30 A with user-installed relay
DC voltage (U
max
): 15 V
Technical specifications
(as definied by the standard)