Atec Teseq-NSG-3040-SOW - Manual

A d v a n c e d Te s t S o l u t i o n s f o r E M C
Teseq’s new NSG 3040-SOW is an easy-to-use stand alone generator for Slow Damped Oscillatory
Wave testing (100 kHz and 1 MHz) in compliance with IEC/EN 61000-4-18 and ANSI C37.90.1, for single
phase equipment up to 270 V/16 A. Unique NSG 3040-SOW capabilities enable users not only to perform
tests according to exact standard requirements, but also to test at higher levels when over-testing is
required, and to test under conditions that are closer to reality, ensuring their product will perform as
intended in the real world.
Unique NSG 3040-SOW capabilities include higher voltage levels (up to 4.4 kV) ideal for development
and over-testing purposes. Common mode, differential mode, and single/multiple line to ground coupling.
Unique NSG 3040-SOW source impedance values that refl ect actual reality conditions. The NSG
3040-SOW features a selectable source impedance of 200 Ω and 150 Ω. According to standard, 200 Ω is the
fi xed output impedance, while the 150 Ω value represents the actual impedance of cables (twisted pairs).
A 7” touch panel display with superb contrast and colour makes controlling the NSG 3040-SOW
easy. For fast and effi cient data entry, input devices include an integrated keyboard and a thumbwheel
with additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environ-
ment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance
(TA) function.
Convenient touch input buttons make each parameter’s value highly visible and allow the user to
quickly select and modify all settings.
With expert mode users can make manual parameter changes using the thumbwheel while a
test is under way, providing an effective and fast method for identifying critical threshold values.
The NSG 3040-SOW has an Ethernet port for external PC control. The Windows-based control
software simplifi es test programming and compilation of complex test sequences with various types of
tests. Test reports can be generated during the test operation, allowing the operator to enter observations
as the test progresses and increasing the effi ciency of long-term tests.
IEC/EN 61000-4-18 &
ANSI C37.90.1 compliant
100 kHz and 1 MHz oscillation
frequency from 0.2 to 4.4 kV
Selectable source impedance
of 200 Ω and 150 Ω
Pulse repetition rate exceeds
standards requirement
Quickly launch tests from
extensive Standards Library or
User Test folders
Easy-to-operate 7“ touchscreen
color display
THE SMART 4 KV SOLUTION FOR
SLOW DAMPED OSCILLATORY WAVE TESTING
NSG 3040-SOW