Atec Tektronix-MSO4000 Series - Manual (Page 3)

Mixed Signal Oscilloscopes — MSO4000 Series, DPO4000 Series
Search – I 2 C decode showing results from a Wave Inspector search for Address value
50. Wave Inspector controls provide unprecedented efficiency in viewing and navigating
waveform data.
Search
Finding your event of interest in a long waveform record can be time
consuming without the right search tools. With today’s record lengths
pushing beyond a million data points, locating your event can mean scrolling
through thousands of screens of signal activity.
The MSO/DPO4000 Series offers the industry’s most comprehensive
search and waveform navigation with its innovative Wave Inspector
®
controls. These controls speed panning and zooming through your record.
With a unique force-feedback system, you can move from one end of your
record to the other in just seconds. User marks allow you to mark any
location that you may want to reference later for further investigation. Or,
automatically search your record for criteria you define. Wave Inspector
will instantly search your entire record, including analog, digital, and serial
bus data. Along the way it will automatically mark every occurrence of your
defined event so you can quickly move between events.
Analyze – Waveform histogram of a falling edge showing the distribution of edge position
(jitter) over time. Included are numeric measurements made on the waveform histogram
data. A comprehensive set of integrated analysis tools speeds verification of your design’s
performance.
Analyze
Verifying that your prototype’s performance matches simulations and meets
the project’s design goals requires analyzing its behavior. Tasks can range
from simple checks of rise times and pulse widths to sophisticated power
loss analysis and investigation of noise sources.
The MSO/DPO4000 Series offers a comprehensive set of integrated
analysis tools including waveform- and screen-based cursors, 29
automated measurements, advanced waveform math including arbitrary
equation editing, waveform histograms, FFT analysis, and trend plots for
visually determining how a measurement is changing over time. Specialized
application support for serial bus analysis, power supply design, and video
design and development is also available.
For extended analysis, National Instrument’s LabVIEW SignalExpress™
Tektronix Edition provides over 200 built-in functions including time and
frequency domain analysis, limit testing, data logging, and customizable
reports.
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