Com-Power PS-400 User Manual

Description, Application, Features

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Description

The PS-400 is a Near Field Probe set consisting of a tip
probe, a broadband probe, a H-field probe and a
custom storage case. Performance and ease of use
were designed into this product. The unique design
allows easy access for tight or hard to reach places
while reducing the effect of hand position or cable
placement.

The tip probe is a precision E-field probe that features
the ability to singularly identify a problem trace or pin.
It is designed to be extremely sensitive to distance
from the source which allows easy discrimination
between traces on a PCB. The unique patented design
allows measurement on individual traces as narrow as
3 mils.

The broadband probe is designed to identify E-fields
over a broad frequency range. In addition, it has more
amplitude sensitivity than the tip probe. Therefore, it
offers a quick and efficient diagnosis of an emission
source allowing the designer to discover and isolate
trouble areas quickly.

The H-field probe's magnetic loop design makes it
ideal for isolating sources of magnetic noise. The
shielded loop construction allows measurement to
minimize the effect of electrical fields.

Application

The PS-400 Near Field Probe Set is designed to assist
in troubleshooting EMI problems both at the board
level and at the component level. It is used to detect
radiation from cables, cases, traces and ICs.

Typically the broadband probe is used to locate the
general area of emission. Then the tip probe is used to
isolate the source to a specific trace or pin. Further
analysis can be done by following the noisy trace to
find the cause of emissions such as a broken transmis-
sion line or impedance mismatch.

A typical use for the H-field probe is to verify the
integrity of the chassis of your computer. This is done
by moving the probe along the seams of the chassis
which may be acting as slot antennas. This probe is
also very useful for detecting magnetic noise sources
such as large current switching circuits or transform-
ers.

By utilizing these probes, potential certification prob-
lems can be discovered and addressed before expen-
sive compliance testing is done. This saves both money
and valuable time. The net result is a reduction in
testing costs and a decreased time to market.

Features

Complete Solution - Includes E and H field probes

Locate Noise Source - Down to a pin with the fine tip

Lightweight - Easy to use and handle

Small Size - Allows easy access to corners

Sensitive to Tip Position - Ease of pinpointing source

Immune to Hand Position - For repeatable results

Optional preamplifier

PS-400

Near Field Probe Set

Com-Power Corporation

(949) 587 - 9800

www. com-power.com

[email protected]

Optional Preamplifier

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