Gentec-EO Diffractive Optics (HBS) - Manual (Page 6)

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HBS Instruction Manual Revision 4.1 Feburary 2014
1.2 INTRODUCTION
The HBS offers an unprecedented range of applications for users of both low and high- power
lasers. Its extraordinary versatility allows to:
- obtain multiple, spacially representative beam samples
- perform sampling in real time
- monitor on-line power/energy
- measure wavelengths
- perform output coupling
- measure pulse width
- measure temporal pulse shape
- obtain near-field and far-field measurements on the
same pulse
- analyze beam profile
- analyze beam quality
- gather information on beam spectral content
The HBS is actually a diffraction grating that produces three useful pairs of transmitted orders
symmetrically disposed with respect to the main beam. First order samples are fully calibrated to
indicate the exact sampling ratio between the diffracted and transmitted beams. This ratio is
indicated on the top of the HBS handling box. Characterization of the second order sampling ratio
can be performed upon request. No characterization is available for third and higher orders.
The second order samples are produced at +/- 20° from the zero order beam (transmitted main
beam) for standard HBS models, when the beam to be sampled is at normal incidence on the
HBS input surface.