Switching characteristics – Cypress CY7C0251AV User Manual

Page 9

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CY7C024AV/024BV/025AV/026AV

CY7C0241AV/0251AV/036AV

Document #: 38-06052 Rev. *J

Page 9 of 19

Figure 4. AC Test Loads and Waveforms

3.0V

GND

90%

90%

10%

3 ns

3 ns

10%

ALL INPUT PULSES

(a) Normal Load (Load 1)

R1 = 590

Ω

3.3V

OUTPUT

R2 = 435

Ω

C = 30 pF

V

TH

= 1.4V

OUTPUT

C = 30pF

(b) Thévenin Equivalent (Load 1)

(c) Three-State Delay (Load 2)

R1 = 590

Ω

R2 = 435

Ω

3.3V

OUTPUT

C = 5 pF

R

TH

= 250

Ω

including scope and jig)

(Used for t

LZ

, t

HZ

, t

HZWE

, and t

LZWE

Switching Characteristics

Over the Operating Range

[20]

Parameter

Description

CY7C024AV/024BV/025AV/026AV

CY7C0241AV/0251AV/036AV

Unit

-20

-25

Min

Max

Min

Max

Read Cycle

t

RC

Read Cycle Time

20

25

ns

t

AA

Address to Data Valid

20

25

ns

t

OHA

Output Hold From Address Change

3

3

ns

t

ACE

[21]

CE LOW to Data Valid

20

25

ns

t

DOE

OE LOW to Data Valid

12

13

ns

t

LZOE

[22, 23, 24]

OE Low to Low Z

3

3

ns

t

HZOE

[22, 23, 24]

OE HIGH to High Z

12

15

ns

t

LZCE

[22, 23, 24]

CE LOW to Low Z

3

3

ns

t

HZCE

[22, 23, 24]

CE HIGH to High Z

12

15

ns

t

PU

[24]

CE LOW to Power Up

0

0

ns

t

PD

[24]

CE HIGH to Power Down

20

25

ns

t

ABE

[21]

Byte Enable Access Time

20

25

ns

Write Cycle

t

WC

Write Cycle Time

20

25

ns

t

SCE

[21]

CE LOW to Write End

15

20

ns

t

AW

Address Valid to Write End

15

20

ns

t

HA

Address Hold From Write End

0

0

ns

t

SA

[21]

Address Setup to Write Start

0

0

ns

Notes

20. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified I

OI

/I

OH

and 30 pF load capacitance.

21. To access RAM, CE = L, UB = L, SEM = H. To access semaphore, CE = H and SEM = L. Either condition must be valid for the entire t

SCE

time.

22. At any given temperature and voltage condition for any given device, t

HZCE

is less than t

LZCE

and t

HZOE

is less than t

LZOE

.

23. Test conditions used are Load 3.
24. This parameter is guaranteed but not tested. For information on port to port delay through RAM cells from writing port to reading port, refer to

Figure 12

.

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