Cypress CY7C0430BV User Manual

Page 28

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CY7C0430BV
CY7C0430CV

Document #: 38-06027 Rev. *B

Page 28 of 37

number of TCK cycles depending on the TCK and CLKBIST

frequency.

t

CYC

is total number of TCK cycles required to run MBIST.

SPC is the Synchronization Padding Cycles (4–6 cycles).
m is a constant represents the number of read and write opera-

tions required to run MBIST algorithms (31195136).
Once the entire MBIST sequence is completed, supplying

extra TCK or CLKBIST cycles will have no effect on the MBIST

controller state or the pass-fail status.

Debug Mode
With the CYBIST instruction loaded and the MCR loaded with

the value of “01,” and the FSM transitions to RUN_TEST/IDLE

state, the MBIST goes into CYBIST-debug mode. The debug

mode will be used to provide complete failure analysis infor-

mation at the board level. It is recommended that the user runs

the non-debug mode first and then the debug mode in order to

save test time and to set an upper bound on the number of

scan outs that will be needed. The failure data will be scanned

out automatically once a failure occurs using the JTAG TAP

interface. The failure data will be represented by a 100-bit

packet given below. The 100-bit Memory Debug Register

(MDR) will be connected between TDI and TDO, and will be

shifted out on TDO, which is synchronized to TCK.
Figure 3 is a representation of the 100-bit MDR packet. The

packet follows a two-bit header that has a logic “1” value, and

represents two TCK cycles. MDR[97:26] represent the BIST

comparator values of all four ports (each port has 18 data

lines). A value of “1” indicates a bit failure. The scanned out

data is from LSB to MSB. MDR[25:10] represent the failing

address (MSB to LSB). The state of the BIST controller is

scanned out using MDR[9:4]. Bit 2 is the Test Done bit. A “0”

in bit 2 means test not complete. The user has to monitor this

bit at every packet to determine if more failure packets need to

be scanned out at the end of the BIST operations. If the value

is “0” then BIST must be repeated to capture the next failing

packet. If it is “1,” it means that the last failing packets have

been scanned out. A trailer similar to the header represents

the end of a packet.

MCR_SCAN
This instruction will connect the Memory BIST Control

Register (MCR) between TDI and TDO. The default value

(upon master reset) is “00.” Shift_DR state will allow modifying

the MCR to extend the MBIST functionality.

MBIST Control States
Thirty-five states are listed in Table 7. Four data algorithms are

used in debug mode: moving inversion (MIA), march_2 (M2A),

checkerboard (CBA), and unique address algorithm (UAA).

Only Port 1 can write MIA, M2A, and CBA data to the memory.

All four ports can read any algorithm data from the QuadPort

DSE device memory. Ports 2, 3, and 4 will only write UAA data.

Boundary Scan Cells (BSC)
Table 9 lists all QuadPort DSE family I/Os with their associated

BSC. Note that the cells have even numbers. Every I/O has

two boundary scan cells. Bidirectional signals (address lines,

datalines) require two cells so that one (the odd cell) is used

to control a three-state buffer. Input only and output only

signals have an extra dummy cell (odd cells) that are used to

ease device layout.

t

CYC

t

CYC

CLKBIST

[

]

t

CYC

TCK

[

]

-------------------------------------------- m SPC

+

×

=

1

1

1

1

97

99

98

P4_IO(17-9)

P3_IO(17-9)

P1_IO(17-9)

P2_IO(17-9)

P4_IO(8-0)

P3_IO(8-0)

P1_IO(8-0)

P2_IO(8-0)

A(15-0)

MBIST_State

P/F

62

61

26

25

10

9

4

3

2

1

0

TD

Figure 3. MBIST Debug Register Packet

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