Data retention and endurance, Capacitance, Thermal resistance – Cypress CY14B101Q3 User Manual

Page 14: Ac test conditions

Advertising
background image

PRELIMINARY

CY14B101Q1
CY14B101Q2
CY14B101Q3

Document #: 001-50091 Rev. *A

Page 14 of 22

AC Test Conditions

Input Pulse Levels.................................................... 0V to 3V
Input Rise and Fall Times (10% - 90%) ....................... <3 ns
Input and Output Timing Reference Levels.....................1.5V

Data Retention and Endurance

Parameter

Description

Min

Unit

DATA

R

Data Retention

20

Years

NV

C

Nonvolatile STORE Operations

200

K

Capacitance

Parameter

[6]

Description

Test Conditions

Max

Unit

C

IN

Input Capacitance

T

A

= 25

°C, f = 1MHz,

V

CC

= 3.0V

6

pF

C

OUT

Output Pin Capacitance

8

pF

Thermal Resistance

Parameter

[6]

Description

Test Conditions

8-SOIC

8-DFN

Unit

Θ

JA

Thermal Resistance

(Junction to Ambient)

Test conditions follow standard test

methods and procedures for measuring

thermal impedance, per EIA / JESD51.

TBD

TBD

°C/W

Θ

JC

Thermal Resistance

(Junction to Case)

TBD

TBD

°C/W

Figure 20. AC Test Loads and Waveforms

3.0V

OUTPUT

5 pF

R1

R2

789

Ω

3.0V

OUTPUT

30 pF

R1

R2

789

Ω

577

Ω

577

Ω

Note

6. These parameters are guaranteed by design and are not tested.

[+] Feedback

Advertising
This manual is related to the following products: