Measurement Computing Daq PC-Card - Manual (Page 14)

1-6 DaqBook Quick Start Guide 1-10-00 457-0941, rev 1.2
Note: Testing the DaqBook device may, in some cases, cause the system to hang. If test results are not displayed in 30 seconds or the
system does not seem to be responding, reboot the system. Upon power-up, re-enter the Daq Configuration and change the
DaqBook configuration settings to those that work properly.
DaqBook Properties Tab
Resource Tests
Resource tests are intended to test system capability for the current device configuration. These
tests are pass/fail. Resource test failure may indicate a lack of resource availability or a resource
conflict.
Base Address Test – Tests the base address for the selected parallel port. Failure of this test
may indicate that the parallel port is not properly configured within the system. See relevant
operating system and computer manufacturer’s documentation to correct the problem.
Interrupt Level Test – Tests the ability of the parallel port to generate interrupts. Failure of
this test may indicate that the parallel port may be currently unable to generate the necessary
hardware interrupt, while other parallel port devices may work OK in this mode. Some parallel
port devices (such as printers) do not require interrupts to work properly. See relevant operating
system and computer manufacturer’s documentation to correct the problem.
Performance Tests
Performance tests are intended to test various DaqBook functions with the current device
configuration. These tests give quantitative results for each supported functional group. The
results represent maximum rates at which the various operations can be performed. These rates
depend on the selected parallel port protocol and will vary according to port hardware capabilities.
ADC FIFO Input Speed – tests the maximum rate at which data can be transferred from the
DaqBook’s internal ADC FIFO to computer memory through the parallel port. Results are given
in samples/second, where a sample (2 bytes in length) represents a single A/D value.
Digital I/O Input Speed – tests the maximum rate at which DIO input data can be transferred
from the DaqBook’s Digital I/O ports to computer memory through the parallel port. Results are
given in bytes/second.
Digital I/O Output Speed – tests the maximum rate at which DIO output data can be
transferred from the computer’s memory to the DaqBook’s Digital I/O ports through the parallel
port. Results are given in bytes/second.
Test Hardware Tab
Test Results
Note: If you experience difficulties, please consult your user documentation (on CD, or hardcopy) before calling technical support.
User documentation includes troubleshooting, as well as a great deal of information regarding specific DBK cards and modules.