Verilink QUAD T1 (880-503345-001) Product Manual - Manual (Page 45)

Diagnostics and Alarms
Verilink QUAD T1 User Manual 5-3
Bn) send PLB BOP Sends a request for a payload loopback in the 4K FDL portion of ESF framing.
Produces a loopback in the remote CSU that faces the local QUAD T1 module. This
loopback will not work on a T1 facility which passes through a DACS unless the FDL
portion of the ESF framing is mapped through the DACS.
S) insert single error Used while transmitting a test pattern only, this causes the deliberate transmission
of a single error. Used to verify that a loopback is actually in place, this should
cause the BERT count to increment by one.
En) reset test counter Resets the test counter for the selected port to zero.
Tn) test pattern Selects a test pattern to be transmitted toward the network, usually used after first
establishing a local or remote loopback. The available test patterns are:
1)none—no test pattern
2)3/24—3 in 24, a minimum of three ones in any 24 sequential bits. A low density
test pattern recommended for B8ZS T1 circuits.
3)QRSS—Quasi Random Signal Sequence, favored by network service providers and
widely supported in test sets. This pattern may fail on an AMI T1 if density
enforcement is 12.5%.
4)2N20-1—2 in 10 to the 20th power minus one, a very low density test pattern
that resembles some live data patterns. Useful on B8ZS T1s.
5)1/8—1 in 8, a minimum of one bit in every eight will be a one (pulse). Very widely
supported and should pass even on an AMI T1 facility. Maintains the minimum
ones density requirement (12.5%) of an AMI T1. Recommended for testing any T1.
6)2N15-1—2 in 10 to the 15th power minus one, a low density test pattern that
resembles some live data patterns. Useful on B8ZS T1s.
7)ALL 0'S—Continuous pattern of framed all zeros, this test should always be run
when installing a B8ZS T1 facility. It will fail immediately if any portion of a B8ZS T1
is accidentally mis-configured for AMI. Not a valid test on an AMI T1.
8)55 OCTET—Not supported.
9)ALL 1'S—A framed pattern of all ones, this causes maximum current on the T1
because a pulse is sent each bit time. All ones is useful for finding marginal
repeaters. This maximum density test should be run on every T1 circuit during the
installation process.
10)2N11-1—2 in 10 to the 11th power minus one, a low density test pattern.
11)USER1—Not supported.
X) exit this menu Exits to the Main Menu .
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