HP 16500B - Manual (Page 122)

Self-Tests Description
The self-tests identify the correct operation of the major sub-systems in the
HP 16500B Logic Analysis System mainframe. The self-tests are not intended for
component-level diagnostics.
Two types of tests are performed on the HP 16500B mainframe: the power-up
self-tests and the functional performance verification tests.
The power-up self-tests are performed when power is applied to the instrument.
When the power-up self- tests are completed and the mainframe sub-systems are
determined to be operational, the system configuration menu is displayed.
The functional performance verification tests are run using a separate operating
system, the performance verification (PV) operating system. The PV operating
system resides on the hard disk drive and can be accessed through the System Test
menu.
A third type of test, parametric performance verification (parametric PV), is not
performed on the HP 16500B mainframe. However, parametric PV is performed on
the modules installed in the mainframe. Consult the individual Service Guides for
each of the modules for more information about parametric performance verification.
Power-Up Self-Tests
The HP 16500B power-up tests check the mainframe circuitry only. None of the option
modules are tested at power-up. The tests run every time power is applied to the instrument
and the results of the tests are reported on the screen.
If a disk is not installed in the disk drive, the advisory "no disk" is added to the Flexible Disk
Tests.
If any of the self-tests fail, then the power-up routine is halted and the FATAL ERRORS
ENCOUNTERED, BOOT HALTED message appears. A failure indicates that one of the
mainframe sub-systems is seriously impaired to the point that reliable operation is not
possible, or that a sub-systems is non-operational. The mainframe hardware would require
servicing before the mainframe can be used.
If any power-up self-test fails, refer to chapter 5, "Troubleshooting."
The power-up tests perform the following circuit checks: ROM Test, RAM Test, Interrupt
Test, Display Test, HIL Controller Test, Front-panel Test, Touchscreen Test, Correlator Test,
Hard Disk Test, and Flexible Disk Test.
ROM Test
The ROM Test performs a checksum of both ROMs and compares the checksum value to a
stored value. The test responses are "passed," "impaired," or "failed." If the message
"impaired" is displayed, only one of the ROMs on the microprocessor board is defective. If the
message "failed" is displayed, both ROMs are defective. For ROM Test failures, you can
suspect a faulty microprocessor board.
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