Integrated system in board, Isb-solo isb-duo isb-quad – Sanyo EP92H User Manual

Page 4

Advertising
background image

Integrated System in Board is a type of SiP (system in package) technology, and is a module technology that achieves high
densities and thinner form factors by using SANYO's unique substrate and mounting technologies. The Integrated System in
Board lineup consists of three types of process: ISB-Solo, ISB-Duo, and ISB-Quad. Which process is used is selected based on
the application.
In addition to standard products, customer specified circuit blocks can also be converted to Integrated System in Board using an
optimal process, thus creating a new module device in a short time.

7

6

Integrated System in Board

Integrated System in Board

Thickness of only 0.45 mm (0.65 mm if resistors are included) realizes excellent thermal radiation and
short development TAT

Optimal for SiP implementation of small-scale block that includes semi-power semiconductors.

Adopts unique SANYO-developed 0.2 mm thickness high-density substrate (2 layers)

Line 40

µ

m / Space 40

µ

m at 25

µ

m thickness copper foil,

Via diameter 100

µ

m / Via land diameter 150

µ

m

Thickness of only 0.53 mm (0.73 mm if resistors are included) realizes high-density mounting

Optimal for SiP implementation of high-frequency (up to 10 GHz) blocks, blocks that require

performance or EMC workarounds based on component placement/wiring pattern, and blocks that
require partial high-density mounting.

Adopts unique SANYO-developed 0.24 mm thickness high-density substrate (4 layers)

Thickness of only 0.6 mm realizes high-density mounting

Optimal for SiP implementation of high-frequency (up to 10 GHz) blocks, blocks that require performance
or EMC workarounds based on component placement /wiring pattern, and subsystems that require high-
density mounting.

Chip-on-Board type

Assembly structure examples

Integrated System in Board

Earlier mounting

Integrated System in Board

Top surface

Back surface

Mounting area reduced by 80%

4.45

Ч

4.45

Ч

0.65 mm

3

Integrated System in Board

Earlier mounting

Integrated System in Board

Top surface

Back surface

Mounting area reduced by 58%

4.3

Ч

4.3

Ч

0.73 mm

3

Passive components

(resistors and capacitors)

ISB-Duo

ISB-Quad

WS-CSP

Flip Chip

0.24 mm

Application example (Cell phone charger circuit block)

Application example (Clock detector block)

Assembly structure examples

Assembly structure examples

Reduced wiring area due to implementation as miniature modules

Integration of noise reducing components

Supply voltage stabilization by using dedicated layers for power supply and ground

Dedicated power
supply/ground layer

Integration of noise

reducing components

LSI

Analysis conditions

Chip heat generation

Chip size

Land size

Atmospheric temperature

Cooling conditions

Analysis model

3 [W]

4

4

0.3 [mm

3

]

5

5

0.03 [mm

3

]

25 [

°

C]

Ideal cooling of the solder lower
surface;

25 [

°

C]

1/4 model (since symmetrical)

Maximum

temperature

40.4 [

°

C]

Maximum

temperature

54.3 [

°

C]

Maximum temperature

92.7 [

°

C]

Temperature
difference

38.4

°

C

Temperature

difference

52.3

°

C

MK

Z

Y

X

MK

Z

X

Y

MK

X

Y

97

81

65

49

33

89

73

57

41

25

Typical BGA

Integrated System Board
that dissipates heat

Integrated System Board package

Integrated System in Board Process Lineup

ISB-Solo

ISB-Duo

ISB-Quad

Noise suppression effect (measured)

Heat dissipation effect (simulation)

Module technologies that achieve high-density and thinner form factors

SANYO Original technology

Evaluation results using a microcontroller and SRAM
(Surface probe method - 30 MHz to 1 GHz)

SRAM

10 mm

×

10 mm

SRAM

Noise is reduced

significantly

Microcontroller

Microcontroller

Wiring on board
Integration of

noise

reducing components

Integrated System in
Board stack structure
(high-density mounting)
Integration of

noise

reducing components

Reasons noise can be reduced by Integrated Sysytem in Board

ISB-Duo (2-layer ISB)

Separate microcontroller
and SRAM

Surface scan using a field probe

Advertising