Emi and environmental type tests, Ruggedswitch, Rs900 – RuggedCom RS900 User Manual
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RuggedSwitch
®
RS900
RuggedSwitch
®
RS900
9-Port Managed Ethernet Switch with Fiber Optical Uplinks
EMI and Environmental Type Tests
Notes: 1. Class 2 refers to “Measuring relays and protection equipment for which a very high security margin is required or where the vibration levels are very high, ( e.g. shipboard application and for severe transportation conditions”)
NEMA TS-2 Requirements
Test
Description
Levels
Performance Criteria*
TS-2 1998, Section 2, para 2.2.7.3
Temperature: Low Temperature/Low
Voltage
89.0 VAC @ -34°C
EUT Continued to function properly during
and following all temperature and humidity
testing
TS-2 1998, Section 2, para 2.2.7.4
Temperature: Low Temperature/High
Voltage
135.0VAC @ -34°C
TS-2 1998, Section 2, para 2.2.7.5
Temperature: High Temperature/High
Voltage
135.0VAC @ + 75°C
TS-2 1998, Section 2, para 2.2.7.6
Temperature: High Temperature/Low
Voltage
89.0VAC @ + 75°C
TS-2 1998, Section 2 para. 2.2.8.4
Vibration Endurance Test
0.5g @ 30Hz for 1hr on all three planes
EUT functioned properly following test
procedure. No physical damage.
TS-2 1998, Section 2, para 2.1.10
Mechanical Shock
+/-10g half sine wave for 11msec on all
three planes
EUT functioned properly following test
procedure. No physical damage.
TS-2 1992, Section 2, para. 2.1.6.1
Electrical Transients: High Repetition Noise
(AC Terminals)
One +/-300VDC pulse every other cycle
once every 3 seconds across 360 ° of line
cycle (2500W peak)
EUT functioned properly during and follow-
ing test procedure. No damage
TS-2 1998, Section 2 para. 2.1.6.2
Electrical Transients: Low-Repetition High
Energy (AC Terminals
One +/-600VDC pulse every second, ran-
domly distributed across 360 ° of line cycle.
Ten pulses total.
EUT functioned properly during and follow-
ing test procedure. No damage
TS-2 1998, Section 2, para 2.1.7
Electrical Transients: I/O Terminals
One +/-300VDC pulse every second, mini-
mum 5 pulses per port
EUT functioned properly during and follow-
ing test procedure. No damage
TS-2 1992, Section 2, para. 2.1.8
Electrical Transients: Nondestruct Transient
Immunity (AC Terminals)
One +/-1000VDC pulse every two seconds,
3 per each polarity.
EUT functioned properly following test
procedure. No damage