Rainbow Electronics ADC12062 - Manual (Page 5)

Note 5 Human body model 100 pF discharged through a 1 5 kX resistor Machine model ESD rating is 200V
Note 6 See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices
Note 7 Typicals are at a 25 C and represent most likely parametric norm
Note 8 Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)
Note 9 Integral Linearity Error is the maximum deviation from a straight line between the measured offset and full scale endpoints
Note 10 Dynamic testing of the ADC12062 is done using the ADC IN input The input multiplexer adds harmonic distortion at high frequencies See the graph in the
Typical Performance Characteristics section for a typical graph of THD performance vs input frequency with and without the input multiplexer
Note 11 The signal-to-noise ratio is the ratio of the signal amplitude to the background noise level Harmonics of the input signal are not included in its calculation
Note 12 The contributions from the first nine harmonics are used in the calculation of the THD
Note 13 Effective Number of Bits (ENOB) is calculated from the measured signal-to-noise plus distortion ratio (SINAD) using the equation ENOB e (SINAD b
1 76) 6 02
Note 14 The digital power supply current takes up to 10 seconds to decay to its final value after PD is pulled low This prohibits production testing of the standby
current Some parts may exhibit significantly higher standby currents than the 20 mA typical
Note 15 Power Supply Sensitivity is defined as the change in the Offset Error or the Full Scale Error due to a change in the supply voltage
TRI-STATE Test Circuit and Waveforms
TL H 11490 – 2
TL H 11490 – 3
TL H 11490 – 4
TL H 11490 – 5
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