Rainbow Electronics DS1870 - Manual (Page 22)

DS1870
LDMOS RF Power-Amplifier Bias
Controller
22 ____________________________________________________________________
PWE
PWE <W><V><FFFFh> Password Entry. Until the correct password is written to this location, the only
memory that can be written are addresses 78h to 7Fh. This includes the PWE and Table_Select
locations. All memory is readable regardless of the PWE value.
TBL Sel <R/W><V><00h> Table Select. The DS1870 contains four tables (1 to 5). Writing a (1 to 5) value
to this register grants access to the corresponding table.
TABLE 1 (CONFIGURATION)
Config
Password <R/W><NV><FFFFh> The PWE value is compared against the value written to this location. All
EEPROM memory is write-protected when PWE does not match thisregister.
LUT Sel <R/W><NV><03h> Selects which inputs are used to control the lookup tables.
a) VD2 A one selects the V
D
input to control the drain LUT indexing for POT2 (Table 5). A zero
selects the I
D2
input.
b) VD1 A one selects the V D input to control the drain LUT indexing for POT1 (Table 4). A zero
selects the I D1 input.
Fault Ena <R/W><NV><00h> Configures the maskable interrupt for the FAULT pin.
a) Temp Ena Temperature measurements, outside the threshold limits, are enabled to create an
active interrupt on the FAULT pin.
b) Vcc Ena V CC measurements, outside the threshold limits, are enabled to create an active
interrupt on the FAULT pin.
c) VD Ena V D measurements, outside the threshold limits, are enabled to create an active
interrupt on the FAULT pin.
d) ID1 Ena I
D1
measurements, outside the threshold limits, are enabled to create an active
interrupt on the FAULT pin.
e) ID2 Ena I D2 measurements, outside the threshold limits, are enabled to create an active
interrupt on the FAULT pin.
Scale 0
Vcc Scale <R/W><NV><XXXX> Controls the scaling or gain of the V
CC
measurements. The V
CC
gain is
factory trimmed to 6.5535V FS.
VD Scale <R/W><NV><XXXX> Controls the scaling or gain of the V D measurements. The V D gain is
factory trimmed to 2.500V FS.
ID1 Scale <R/W><NV><XXXX> Controls the scaling or gain of the I D1 measurements. The I D1 gain is
factory trimmed to 0.5V FS.
Scale 1
ID2 Scale <R/W><NV><XXXX> Controls the scaling or gain of the I D2 measurements. The I D2 gain is
factory trimmed to 0.5V FS.
Offset 0
Vcc Offset <R/W><NV><0000h> Allows for offset control of V
CC
measurement
VD Offset <R/W><NV><0000h> Allows for offset control of V D measurement.
ID1 Offset <R/W><NV><0000h> Allows for offset control of I D1 measurement.
Offset 1
ID2 Offset <R/W><NV><0000h> Allows for offset control of I D2 measurement.
Temp Offset <R/W><NV><0000h> Allows for offset control of temperature measurement.
LUT Index