Atec Panametrics-Olympus-Omniscan-MX - Manual (Page 11)

11 www.olympus-ims.com
Acquisition display
Analysis display
Fastener inspection using two frequencies and a dual C-scan display.
Before interpolation
After interpolation
Without filter
With high-pass
digital filtering
Simple Acquisition and Analysis Displays
• Data acquisition in a C-scan view for quick and efficient
defect detection
• Data selection in Analysis mode to review the signal in the
impedance plane and strip charts
• Amplitude, phase, and position measurement
• Adjustable color palette
• Large impedance plane and strip chart views to
accommodate conventional single-channel ECT probe
inspection
Calibration Wizard
• Step-by-step process
• All the channels of a group are calibrated simultaneously,
each channel having its own gain and rotation.
• Amplitude and phase can be set on different reference flaws.
Alarms
• Three alarm outputs can combine LED, buzzer, and TTL
output.
• Various alarm zone shapes can be defined in the impedance
plane (sectorial, rectangular, ring, etc.).
Automatic Probe Detection and Configuration
• C-scan parameters and multiplexing sequence are
automatically set when the probe is connected.
• Frequency range protection to avoid probe damage
Subtraction Tools in Analysis Mode
This function can be used to remove the lift-off variation that is
shown between adjacent channels.
Advanced Real-Time Data Processing
• Real-time data interpolation to improve the spatial
representation of defects
• When working with two frequencies, a MIX signal can be
generated to remove unwanted signals (for example, lift-off,
fastener signals, etc.).
• Several filters can be applied to the data such as high-pass,
low-pass, median, and averaging filters. The illustrations
below represent an application where cracks are located at
the edge of a lap-joint which has a sharp thickness variation.
The filtered data may improve detection, especially for small
cracks.
Eddy Current Array Software