Atec Panametrics-Olympus-Omniscan-MX2 - Manual (Page 8)

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Acquisition
• A scan menu for quick and easy configuration of inspection
parameters for manual, one-line, raster, and helicoidal scans.
• Multiple encoder modes, including Clock, Quadrature, and
Clicker.
• C-scan configuration for amplitude and position C-scans, and
display setup.
• Data storage options for full A-scans, S-scans, and/or C-scans.
• Preconfigured display layouts for easy inspection preparation.
• PRF auto adjustments for optimized, maximum speed, or
manually-controlled settings.
• Data storage options for flash card or USB media devices.
• Real-time data acquisition displays, with the ability to rewrite
data in both scan directions when using an encoder.
• Easy to interface with encoded scanners.
• Different gate-synchronization capabilities.
Pulse Repetition Frequency (PRF)
OmniScan MX
OmniScan MX2 40% better
Saving Inspection Data File to USB (speed)
OmniScan MX
OmniScan MX2 Up to 400% better
Maximum File Size (Mb)
OmniScan MX 160 Mb
OmniScan MX2 300 Mb
Flawless Data Management
An SD Card is used to store data for easy transfer to a computer.
The SD card can also be inserted and removed without having
to reboot the unit. In addition, data can be transferred to exter-
nal media using the USB 2.0 port. The OmniScan MX2 provides
data transfer speeds up to 400% faster than the OmniScan MX
(depending on the device used).
Analysis
• An extensive display menu for preconfigured multigroup and
multiprobe inspection layouts.
• Data, reference, and measurement cursors for defect sizing
and reporting.
• Extensive Readings database for trigonometry, flaw statistics on
axes, volumetric position information, code-based acceptance
criteria, corrosion mapping statistics, etc.
• All Readings are available online, and are also available off-
line when full A-scans are saved in data files.
• Linked displays for interactive analysis of A-scans, B-scans,
S-scans, and C-scans for multigroup and multiprobe
inspections.
• Optimized preconfigured layouts for quick and simple length,
depth, and height sizing of flaws for code-based or non-code-
based inspections.
• Interactive off-line gate repositioning.
Top: Data acquisition
displaying TOFD.
Right: Data acquisition
displaying two phased
array channels and
TOFD.
Weld inspection
display showing the
position of indications
in the RayTracing
display.