Cascade Microtech Pyramid Probes - Manual (Page 3)

PN 153-691-2 www.cascademicrotech.comI Pyramid Probes: Used Core Inspection• 3
Step 3: High Magnification Microscope Inspection
Inspect Core Using the 5x Objective
1. Place the core on a high-magnification fixture with the probe tips up.
Components
Is there any damage to installed components?
Small scratches from the assembly process are acceptable.
Cracked solder joints, cold solder joints or lifted component pads are unacceptable at any time in the core’s life
Damaged components can be waived by Engineering if the electrical signal is not affected.
Note any damage that indicates incorrect handling during installation of the core and provide feedback to
engineeering.
Traces
Is there any high current damage to traces?
The pass/fail criteria is the test program.
Provide feedback to Engineering to check program for current protection on this signal.
Low-magnification photo of wing
on VLSR core. Burnt trace
verifies test failure for open. It has
been damaged by high current.
Low-magnification photo of wing.
These two traces would fail
electrical test as open circuits. They
were damaged by high current.
Pyramid Probes: Used Core Inspection