JDS Uniphase Portable Optical Network Tester MTS-8000 - Manual (Page 2)

MTS-8000 Tester
2
Automatic bi-directional
measurement function
• Automate the acquisition process
• Check fiber continuity
• File transfer through the fiber
• True splice loss with both end analysis
• Optical talkset option needed
Bi-directional OTDR analysis
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Pulse delay method complies with TIA/EIA FOTP-168
DUT
Polarized
Broadband
Source
Analyzer OSA
PMD test results with Pass/Fail analysis
Local
Remote
MTS-8000 00286
UHD 1310/1550/1625 nm
MTS-8000 00439
UHD 1310/1550/1625 nm
Tested fiber
Data
PC software solution for report generation
OFS-100 Results Analysis
• OTDR, CD, PMD, AP, and OSA results
analysis
• Batch processing capability via automation
process
• Pass/Fail function
• Customized printouts
OFS-200 FiberCable Acceptance
Report Generation
• Complete fiber characterization reporting
capability including bi-directional OTDR,
CD, PMD, AP, IL and ORL results
• Advanced OTDR evaluation for loop back
and mid-point management
• Powerful report preview
• Direct access keys for easy process and
efficiency
Single menu for chromatic dispersion trace and table
display
Fiber Characterization
CD Module
• Pulse delay method complies with TIA/EIA
FOTP-168
• Fast single-end measurement with sectional
analysis capability
• CD analyzer and four-wavelength OTDR
(1310/1480/1550/1625 nm) with one module
Physical Fiber Testing
Key features OTDR
• Fast data acquisition enables VHD plug-in
to reach 40 dB after 10 s with a maximum
performance up to 45 dB
• Highest dynamic range with 50 dB at
1550 nm, UHD module
• New VLR module with outstanding dead
zone of 0.8 m EDZ and 4 m ADZ, 43 dB
dynamic
• Fastest scan speed at 0.1 s in real-time mode
• Up to 128000 acquisition points with sam-
pling resolution down to 4 cm
Built-in Optical Talkset
• Data transfer capability: file exchange or
remote control
• Used also for fully automatic bi-directional
measurements
• OTS-55 handheld for far end communica-
tion
PMD Module
• Fixed analyzer method standardized by
ITU-T, IEC and TIA/EIA
• Fast measurement time – from just
6 seconds
• Measure through multiple EDFAs