Test circuit (cont.) – Renesas HD74LVC1G66 User Manual

Page 7

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HD74LVC1G66

Rev.3.00 Jul. 01, 2004 page 7 of 10

Test Circuit (cont.)

OPEN

OPEN

TEST

S1

VTT

VTT

S1

C

L

R

L

R

L

GND

GND

t / t

PLH

PHL

t / t

ZH

HZ

t / t

ZL

LZ

1.8±0.15

2.5±0.2

3.3±0.3

5.0±0.5

INPUTS

V

CC

(V)

V

CC

2

× V

CC

2

× V

CC

2

× V

CC

2

× V

CC

V

CC

/ 2

V

CC

/ 2

V

CC

/ 2

V

CC

/ 2

V

CC

V

CC

V

CC

V

I

V

ref

C

L

R

L

∆V

VTT

t

r

/ t

f

500

0.15 V

0.15 V

0.3 V

0.3 V

500

500

1.0 k

Load circuit

From Output

≤ 2 ns
≤ 2 ns

≤ 2.5 ns
≤ 2.5 ns

30 pF

30 pF

50 pF

50 pF

V

ref

V

ref

V

ref

V

ref

V

I

0 V

t

PLH

V

t

PHL

OH

V

OL

Input

Output

V

OH

V

OL

Control
Input

V

ref

V

ref

V

ref

V

OH

∆V

V

OL

+

∆V

V

ref

V

I

V

OH

0 V

V

OL

t

HZ

t

LZ

t

ZH

t

ZL

Output
(Waveform – A)

Output
(Waveform – B)

Notes: 1. C

L

includes probe and jig capacitance.

2. Waveform–A is for an output with internal conditions such that the output is low except
when disabled by the output control.
3. Waveform–B is for an output with internal conditions such that the output is high except
when disabled by the output control.
4. All input pulses are supplied by generators having the following characteristics:

PRR

≤ 10MHz, Zo = 50 Ω.

5. The output are measured one at a time with one transition per measurement.

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