Test-clip, The plcc test-clip, Surface mount – A P Products Test-Clip Special User Manual

Page 10

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10

The PLCC Test-Clip

All four sides open simultaneously for easy attachment on PLCC or LCC chips.











Surface Mount

TEST-CLIP

A P Products GmbH

LCC

PLCC

Alloy

20

Gold

923680-20
923685-20

923670-20
923675-20

Alloy

28

Gold

923680-28
923685-28

923670-28
923675-28

Alloy

44

Gold

923680-44
923685-44

923670-44
923675-44

Alloy

52

Gold

923680-52
923685-52

923670-52
923675-52

Alloy

68

Gold

923680-68
923685-68

923670-68
923675-68

Alloy

84

Gold

923680-84
923685-84

923670-84
923675-84

This Test-Clip is for testing Plastic Leaded Chip Carrier (PLCC) style
integrated circuits. The unique action wedge design with all four
sides opening simultaneously provides a faster and easier
attachment to the PLCC.

The helical compression spring and insulating contact combs insure
integrity in contact when testing. Our narrow body design allows
components to be tested with as little as 2,54 mm (0,1") lead-to-lead
spacing, side stackable at 0,200" lead-to-lead spacing.

Probe access points are immediately visible for fast and safe
individual lead testing, while staggered contact rows on 0,100"
centers allow for easy probe attachment and help prevent accidental
shorting of adjacent probes, Industry standard 0,635 mm square
contact pins permit easy attachment of female socket connectors or
wire wrapping.

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