Test-clip – A P Products Test-Clip Special User Manual

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The IC Test-Clip for fast, safe access to DIP Leads

Since 1967 in the market, our Test-Clip has remained the industry
standard for faster easier DIP IC Testing, quality control inspection,
and field service. A P Products Test-Clips have become an
indispensable tool to the electronic industry.

We're introducing today the industry largest selection of Test-Clips.
With 144 models to fit every size DIP up to 64-pins and both nailed
and connector-compatible "headless" leads available in every size,
A P Products has just the right Test-Clip to meet your DIP testing
requirements.

Easy attachment
Narrow nose shape for working on high density PC-boards. Fits onto IC's with only 2,5 mm between leads and
adjacent components.

Positive clamping
The heavy duty industrial grade metal springs provide a firm positive grip to the DIP under test. The weight of the
probes and test leads can't disturb connections, eliminating intermittents and false readings.

Reliable contacts
Proven contact wiping action for optimum reliability. New are "Paint Cut" contacts for ICs with antistatic protection
coating, as often used in military applications. These contacts will cut through the protective coating. Stripping the
coat prior to testing is no longer necessary. The test marks can easily be touched up after testing.

Save way to test
The contact comb fits between DIP leads to eliminate any possibility of shorting out chips.

Rugged construction
Body material is tough, engineering grade glass filled PBT. The contacts are made from hardened Nickel Silver.
Hinge design with steel pivot pin for smooth, long lasting use.


A P Products GmbH

TEST-CLIP

Specifications:

Plastic:

PBT, glass filled (30%), UL 94 VO

Contacts:

CuNi18Zn20, unplated or gold plated

Temp. Range:

-55 °C to +165 °C

Rel. Humidity:

<80%

Max. Current:

2 A

Max. Voltage:

250 V

Test Voltage:

Contact - Contact = 1000 V

Contact - Ground = 1500 V

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