Vishay semiconductor italy, Thermal-mechanical specification, Electrical characteristics @ t – C&H Technology GT100NA120U User Manual

Page 3: 25°c (unless otherwise specified)

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GT100NA120U

Vishay Semiconductor Italy

2

Revision 18-Mar-09

R

thCS

Case-to-Sink, flat, greased surface

0.05

°C/ W

T

Mounting torque (M3 screw)

1.3

Nm

Wt

Weight

30

g

Diode

R

thJC

Junction-to-Case, diode thermal resistance

0.37

°C/ W

IGBT
R

thJC

Junction-to-Case, IGBT thermal resistance

0.2

4

°C/ W

PARAMETERS

MIN

TYP

MAX

UNITS

THERMAL-MECHANICAL SPECIFICATION

Clamping Diode
I

RM

Reverse leakage current

10

μA

1200V

0.5

mA

1200V, T

J

= 125°C

V

F M

Forward voltage drop

4.4

V

I

C

= 100A

5.2

I

C

= 100A, T

J

= 125°C

IGBT
BV

CES

Collector to emitter breakdown volt. 1200

V

V

GE

= 0V, I

C

= 500μA

ΔV

BR(CES)

/

ΔT

J

Temp. coefficient of breakdown

0.05

V/°C V

GE

= 0V, I

C

= 1mA (25°C-150°C)

V

CE(on)

Collector to emitter voltage

1.79

V

GE

= 15V, I

C

= 50A

2.4

V

V

GE

= 15V, I

C

= 100A

2.0

V

GE

= 15V, I

C

= 50A T

J

= 125°C

2.7

V

GE

= 15V, I

C

= 100A

V

GE(th)

Gate threshold voltage

5.8

V

V

CE

= V

GE

, I

C

= 500μA

ΔV

GE(th)

/

ΔT

J

Temp.coeff. of threshold voltage

-30

mV/°C V

CE

= V

GE

, I

C

= 1mA (25°C-150°C)

I

CES

Zero gate voltage collector current

10

μA

V

GE

= 0V, V

CE

= 1200V

100

V

GE

= 0V, V

CE

= 1200V, T

J

= 125°C

I

GES

Gate to emitter leakage current

± 200

n

A

Lo

A V

GE

= ± 20V

PARAMETERS

MIN

TYP MAX UNITS TEST CONDITIONS

ELECTRICAL CHARACTERISTICS @ T

J

= 25°C

(unless otherwise specified)

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