Test waveforms and measurement levels, Output test load – Rainbow Electronics AT45DB642 User Manual
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AT45DB642
1638F–DFLSH–09/02
Test Waveforms and Measurement Levels
Output Test Load
AC Characteristics – Parallel Interface
Symbol
Parameter
Min
Max
Units
f
SCK1
CLK Frequency
5
MHz
f
CAR1
CLK Frequency for Continuous Array Read
3
MHz
f
BARSD1
CLK Frequency for Burst Array Read with Synchronous Delay
5
MHz
t
WH
CLK High Time
80
ns
t
WL
CLK Low Time
80
ns
t
CS
Minimum CS High Time
250
ns
t
CSS
CS Setup Time
250
ns
t
CSH
CS Hold Time
250
ns
t
CSB
CS High to RDY/BUSY Low
150
ns
t
SU
Data In Setup Time
75
ns
t
H
Data In Hold Time
25
ns
t
HO
Output Hold Time
0
ns
t
DIS
Output Disable Time
55
ns
t
V
Output Valid
70
ns
t
XFR
Page to Buffer Transfer/Compare Time
700
µs
t
EP
Page Erase and Programming Time
20
ms
t
P
Page Programming Time
14
ms
t
PE
Page Erase Time
8
ms
t
BE
Block Erase Time
12
ms
t
RST
RESET Pulse Width
10
µs
t
REC
RESET Recovery Time
1
µs
AC
DRIVING
LEVELS
AC
MEASUREMENT
LEVEL
0.45V
2.0
0.8
2.4V
tR, tF < 3 ns (10% to 90%)
DEVICE
UNDER
TEST
30 pF