Atec Agilent-PNA Series - Manual (Page 10)

10
Description Specification Supplemental information
Test port noise floor a
300 kHz to 25 MHz b
10 Hz IF bandwidth ≤ –115 dBm
1 kHz IF bandwidth ≤ –95 dBm
25 MHz to 3 GHz b
10 Hz IF bandwidth
≤ –118 dBm
1 kHz IF bandwidth ≤ –98 dBm
3 GHz to 9 GHz
10 Hz IF bandwidth ≤ –108 dBm
1 kHz IF bandwidth ≤ –88 dBm
Receiver noise floor a
300 kHz to 25 MHz c
10 Hz IF bandwidth ≤ –130 dBm
1 kHz IF bandwidth ≤ –110 dBm
25 MHz to 3 GHz c
10 Hz IF bandwidth
≤ –133 dBm
1 kHz IF bandwidth
≤ –113 dBm
3 GHz to 9 GHz
10 Hz IF bandwidth ≤ –123 dBm
1 kHz IF bandwidth ≤ –103 dBm
Crosstalk
300 kHz to 1 MHz < –120 dB Between test ports 1 and 2
1 MHz to 25 MHz < –125 dB with shorts on both ports.
25 MHz to 3 GHz < –128 dB
3 GHz to 6 GHz < –118 dB
6 GHz to 9 GHz < –113 dB
Trace noise magnitude d
1 kHz IF bandwidth <0.002 dB rms
10 kHz IF bandwidth <0.005 dB rms
Trace noise phase d
1 kHz IF bandwidth <0.010° rms
10 kHz IF bandwidth <0.035° rms
Test port input
a. rms value of a linear magnitude trace expressed in dBm.
b. May be limited to -90 dBm at particular frequencies below 750 MHz due to spurious receiver residuals.
c. May be limited to -105 dBm at particular frequencies below 750 MHz due to spurious receiver residuals.
d. Trace noise is defined as a ratio measurement of a through or a full reflection, with the source set to +0 dBm.