Cabletron Systems SFCS-200BX - Manual (Page 122)

B-4
SCP Diagnostics
B.1.2 Running the Hardware Tests
This last portion from the displayed list is the group of hardware tests that the
user can run on the SCP:
test-clock - test Real Time Clock
test-dram - test DRAM
test-dc <bank> <chip> - test DRAM chip # <chip> in bank <bank>
test-ethernet - test Ethernet
test-flash - test Flash
test-fc <chip> - test Flash chip <chip>
test-serial - test Serial Port
test-sram - test SRAM
test-timer - test Timer
test-all - test all devices, except Flash and SRAM
test-manufact - test all devices
Type the test command at the prompt to run the individual test. A test that
completes correctly will be reported as “OK” on both the terminal connected
to the serial port and on the display LED on the front panel of the SCP. A test
that is not successful will be reported as “failure” on the terminal connected
to the serial port and as “BAD” on the display LED. If any of the tests fail,
contact Cabletron Systems’ Technical Support.
The following subsections depict an example of how to perform each test
through the serial port and the SCP’s confirmation message to the terminal
connected to the serial port that the test was successful. The user input is in
avant garde font and the SCP’s response is shown in
courier font.
B.1.2.1 Clock Test
This test checks the real time clock to verify that it is ticking correctly. It takes
about two seconds to run.
=> test-clock
Clock: OK
B.1.2.2 DRAM Test
This test checks the DRAM’s functionality. It takes about two seconds to run.
=> test-dram
DRAM: OK