6 testability, Testability – Avago Technologies LSI53C1020 User Manual

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1-12

Introduction

Version 2.4

Copyright © 2001–2004 by LSI Logic Corporation. All rights reserved.

Provides 2 kV electrostatic discharge (ESD) protection on SCSI
signals

Provides latch-up protection greater than 150 mA

Provides voltage feed-through protection

Supports the Integrated RAID (IR) solution to provide physical
mirroring or striping of the boot volume

Has a high proportion of power and ground pins

Provides power and ground isolation of I/O pads and internal chip
logic

Supports CRC checking and generation in double transition (DT)
phases

Provides comprehensive SureLINK Domain Validation technology:

Basic (Level 1) with inquiry command

Enhanced (Level 2) with read/write buffer

Margined (Level 3) with margining of drive strength and slew
rates

Supports TolerANT technology, which provides:

Active negation of SCSI Data, Parity, Request, and Acknowledge
signals for improved SCSI transfer rates

Input signal filtering on SCSI receivers for improved data
integrity, even in noisy cabling environments

1.8.6

Testability

These features enhance the testability of the LSI53C1020:

Allows all SCSI signals to be accessed through programmed I/O

Supports JTAG boundary scan

Provides ARM Multi-ICE

®

test interface for debugging purposes

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