5 program and erase characteristics, Input test waveforms and measurement levels, Output test load – Rainbow Electronics AT45DB021E User Manual
Page 47
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47
AT45DB021E [PRELIMINARY DATASHEET]
8789B–DFLASH–11/2012
18.5 Program and Erase Characteristics
19.
Input Test Waveforms and Measurement Levels
20.
Output Test Load
Symbol
Parameter
Min
Typ
Max
Units
t
EP
Page Erase and Programming Time (256/264 bytes)
7
35
ms
t
P
Page Programming Time
1.5
4
ms
t
BP
Byte Programming Time
8
μs
t
PE
Page Erase Time
6
30
ms
t
BE
Block Erase Time
15
35
ms
t
SE
Sector Erase Time
350
550
ms
t
CE
Chip Erase Time
2.5
4.5
s
t
OTPP
OTP Security Register Program Time
200
500
μs
AC
Driving
Levels
AC
Measurement
Level
0.1V
CC
V
CC
/2
0.9V
CC
t
R
, t
F
< 2ns (10% to 90%)
Device
Under
Test
30pF
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