Switching time test circuits timing diagram – Diodes ZXGD3003E6 User Manual
Page 4
ZXGD3003E6
© Zetex Semiconductors plc 2007
Electrical characteristics (at Tamb = 25°C unless otherwise stated).
Switching time test circuits
Timing diagram
Parameter
Symbol
Min.
Typ.
Max.
Unit
Conditions
Output voltage, high
V
OH
V
CC
– 0.4
V
I
source
= 1
A
Output voltage, low
V
OL
0.4
V
I
sink
= 1
A
Source output leakage
current
I
L(source)
1
A
V
CC
= 40V,
V
IN1
=
V
IN2
= 0V
Sink output leakage
current
I
L(sink)
1
A
V
CC
= 40V,
V
IN1
=
V
IN2
= V
CC
Quiescent current
I
Q
20
nA
V
CC
= 32V,
V
IN1
=
V
IN2
= 0V
Source output current I
(source)
1
1.6
A
I
IN1
+I
IN2
= 10mA
Sink output current
I
(sink)
1
1.4
A
I
IN1
+I
IN2
= 10mA
Source output current I
(source)PK
5
A
I
IN1
+I
IN2
= 500mA
Sink output current
I
(sink)PK
5
A
I
IN1
+I
IN2
= 500mA
Gate driver
switching times
t
d(rise)
t
r
t
d(fall)
t
f
1.8
8.9
1.7
8.9
ns
ns
ns
ns
C
L
=1nF, R
L
=1
⍀,
V
CC
=12V, V
IN
=10V,
R
S
=25
⍀
Gate driver
switching times
t
d(rise)
t
r
t
d(fall)
t
f
4
77
4
85
ns
ns
ns
ns
C
L
=1nF, R
L
=1
⍀,
V
CC
=12V, V
IN
=10V,
R
S
=1k
⍀