Switching time test circuits timing diagram – Diodes ZXGD3003E6 User Manual

Page 4

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ZXGD3003E6

Issue 2 - October 2007

4

www.zetex.com

© Zetex Semiconductors plc 2007

Electrical characteristics (at Tamb = 25°C unless otherwise stated).

Switching time test circuits

Timing diagram

Parameter

Symbol

Min.

Typ.

Max.

Unit

Conditions

Output voltage, high

V

OH

V

CC

– 0.4

V

I

source

= 1

␮A

Output voltage, low

V

OL

0.4

V

I

sink

= 1

␮A

Source output leakage
current

I

L(source)

1

␮A

V

CC

= 40V,

V

IN1

=

V

IN2

= 0V

Sink output leakage
current

I

L(sink)

1

␮A

V

CC

= 40V,

V

IN1

=

V

IN2

= V

CC

Quiescent current

I

Q

20

nA

V

CC

= 32V,

V

IN1

=

V

IN2

= 0V

Source output current I

(source)

1

1.6

A

I

IN1

+I

IN2

= 10mA

Sink output current

I

(sink)

1

1.4

A

I

IN1

+I

IN2

= 10mA

Source output current I

(source)PK

5

A

I

IN1

+I

IN2

= 500mA

Sink output current

I

(sink)PK

5

A

I

IN1

+I

IN2

= 500mA

Gate driver
switching times

t

d(rise)

t

r

t

d(fall)

t

f

1.8

8.9

1.7

8.9

ns

ns

ns

ns

C

L

=1nF, R

L

=1

⍀,

V

CC

=12V, V

IN

=10V,

R

S

=25

Gate driver
switching times

t

d(rise)

t

r

t

d(fall)

t

f

4

77

4

85

ns

ns

ns

ns

C

L

=1nF, R

L

=1

⍀,

V

CC

=12V, V

IN

=10V,

R

S

=1k

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