Electrical characteristics, Zxmn10a07f, A product line of diodes incorporated – Diodes ZXMN10A07F User Manual
Page 3
ZXMN10A07F
Document number: DS33564 Rev. 6 - 2
3 of 7
August 2012
© Diodes Incorporated
ZXMN10A07F
A Product Line of
Diodes Incorporated
Electrical Characteristics
(@T
A
= +25°C, unless otherwise specified.)
Characteristic
Symbol
Min
Typ
Max
Unit
Test Condition
OFF CHARACTERISTICS
Drain-Source Breakdown Voltage
BV
DSS
100 —
— V
V
GS
= 0V, I
D
= 250
μA
Zero Gate Voltage Drain Current T
J
= +25°C
I
DSS
—
—
1.0 µA
V
DS
= 100V, V
GS
= 0V
Gate-Source Leakage
I
GSS
—
—
100 nA
V
GS
= ±20V, V
DS
= 0V
ON CHARACTERISTICS
Gate Threshold Voltage
V
GS(th)
2 — 4 V
V
DS
= V
GS
, I
D
= 250
μA
Static Drain-Source On-Resistance (Note 9)
R
DS (ON)
—
540 700
m
Ω
V
GS
= 10V, I
D
= 1.5A
700 900
V
GS
= 6V, I
D
= 1A
Forward Transconductance (Notes 9 & 11)
g
fs
—
1.6 — S
V
DS
= 15V, I
D
= 1A
Diodes Forward Voltage (Note 9)
V
SD
—
0.85 0.95
V T
J
= +25°C, I
S
= 1.5A, V
GS
= 0V
DYNAMIC CHARACTERISTICS
Input Capacitance (Notes 10 & 11)
C
iss
—
138 280
pF
V
DS
= 50V, V
GS
= 0V,
f = 1.0MHz
Output Capacitance (Notes 10 & 11)
C
oss
—
12 25
Reverse Transfer Capacitance (Notes 10 & 11)
C
rss
—
6 12
Gate Resistance (Notes 10 & 11)
R
g
—
2 4
Ω
f = 1MHz, V
GS
= 0V, V
DS
= 0V
Total Gate Charge (Notes 10 & 11)
Q
g
—
2.9 6
nC
V
GS
= 10V, V
DS
= 50V,
I
D
= 1A
Gate-Source Charge (Notes 10 & 11)
Q
gs
—
0.7 1.5
Gate-Drain Charge (Notes 10 & 11)
Q
gd
—
1 2
Reverse Recovery Time (Note 11)
t
rr
—
27 60 ns
T
J
= +25°C, I
F
= 1.8A,
di/dt = 100A/µs
Reverse Recovery Charge (Note 11)
Q
rr
—
12 — nC
Turn-On Delay Time (Notes 10 & 11)
t
D(on)
—
1.8 —
ns
V
GS
= 10V, V
DD
= 50V,
R
G
= 6
Ω , I
D
= 1A
Turn-On Rise Time (Notes 10 & 11)
t
r
—
1.5 —
Turn-Off Delay Time (Notes 10 & 11)
t
D(off)
—
4.1 —
Turn-Off Fall Time (Notes 10 & 11)
t
f
—
2.1 —
Notes:
9. Measured under pulsed conditions. Pulse width
≤ 300µs; duty cycle ≤ 2%.
10. Switching characteristics are independent of operating junction temperature.
11. For design aid only, not subject to production testing.