Electrical characteristics, Zxmp6a13fq – Diodes ZXMP6A13FQ User Manual

Page 4

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ZXMP6A13FQ

Document Number DS36684 Rev. 2 - 2

4 of 8

www.diodes.com

December 2013

© Diodes Incorporated

ZXMP6A13FQ



Electrical Characteristics

(@T

A

= +25°C, unless otherwise specified.)

Characteristic Symbol

Min

Typ

Max

Unit

Test

Condition

OFF CHARACTERISTICS
Drain-Source Breakdown Voltage

BV

DSS

-60

V

I

D

= -250μA, V

GS

= 0V

Zero Gate Voltage Drain Current

I

DSS

-0.5

μA

V

DS

= -60V, V

GS

= 0V

Gate-Source Leakage

I

GSS

±100 nA

V

GS

=

20V, V

DS

= 0V

ON CHARACTERISTICS
Gate Threshold Voltage

V

GS(th)

-1.0

-3.0 V

I

D

= -250μA, V

DS

= V

GS

Static Drain-Source On-Resistance (Note 10)

R

DS (ON)

0.4

V

GS

= -10V, I

D

= -0.9A

0.6

V

GS

= -4.5V, I

D

= -0.8A

Forward Transconductance (Notes 10 and 12)

g

fs

1.8

S

V

DS

= -15V, I

D

= -0.9A

Diode Forward Voltage (Note 10)

V

SD

-0.85 -0.95 V T

J

= +25°C, I

S

= -0.8A, V

GS

= 0V

Reverse Recovery Time (Note 12)

t

rr

21.1

ns

T

J

= +25°C, I

F

= -0.9A,

di/dt = 100A/μs

Reverse Recovery Charge (Note 12)

Q

rr

19.3

nC

DYNAMIC CHARACTERISTICS

(Note 12)

Input Capacitance

C

iss

219

pF

V

DS

= -30V, V

GS

= 0V

f = 1.0MHz

Output Capacitance

C

oss

25.7

Reverse Transfer Capacitance

C

rss

20.5

Turn-On Delay Time (Note 11)

t

D(on)

1.6

ns

V

DD

= -30V, I

D

= -1A,

R

G

 6.0Ω V

GS

= -10V

Turn-On Rise Time (Note 11)

t

r

2.2

Turn-Off Delay Time (Note 11)

t

D(off)

11.2

Turn-Off Fall Time (Note 11)

t

f

5.7

Total Gate Charge (Note 11)

Q

g

2.9

nC

V

DS

= -30V, V

GS

= -4.5V,

I

D

= -0.9A

Total Gate Charge (Note 11)

Q

g

5.9

nC

V

DS

= -30V, V

GS

= -10V,

I

D

= -0.9A

Gate-Source Charge (Note 11)

Q

gs

0.74

Gate-Drain Charge (Note 11)

Q

gd

1.5

Notes:

10. Measured under pulsed conditions. Pulse width = 300μs. Duty cycle ≤ 2%.

11. Switching characteristics are independent of operating junction temperature.

12. For design aid only, not subject to production testing






































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