Zht431, Typical operating conditions, Gain v frequency – Diodes ZHT431 User Manual
Page 4: Stability boundary conditions, Pulse response, Test circuit for open loop voltage gain, Test circuit for stability boundary conditions, Test circuit for pulse response
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ZHT431
ZHT431
Document number: DS32157 Rev. 11 - 2
4 of 8
November 2010
© Diodes Incorporated
A Product Line of
Diodes Incorporated
Typical Operating Conditions
(Cont.)
Gain v Frequency
Frequency (Hz)
Load Capacitance (F)
Stability Boundary Conditions
Time ( µs)
Pulse Response
I
Z
15k
V
Z
V
Z
Test Circuit for Open Loop Voltage Gain
8k25
9μF
230
+
-
I
Z
= 10mA, T
A
= 25°C
Test Circuit for Stability Boundary Conditions
Input
150
10k
V
ref
< V
Z
< 20, I
Z
= 10mA, T
A
= 25°C
V
Z
I
Z
Input Monitor
Test Circuit for Pulse Response
220
50
Pulse
Generator
T
A
= 25°C
60
40
20
0
100
1k
10k
100k
1M
)
B
d(
ni
a
G
e
g
atl
o
V
p
o
o
L
n
e
p
O
)
V(
g
ni
w
S
e
g
atl
o
V
2.0
0
0
0.4
0.6
0.8
1.0
0.2
1.0
0
5.0
3.0
Repetitive pulse
Single pulse
V
Z
INPUT
STABLE
STABLE
0
10p
20
40
60
80
100
100p
1000p
0.01µ
0.1µ
1µ
)
A
m(
t
n
er
r
u
C
e
d
o
ht
a
C
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