Zr431, Adjustable precision zener shunt regulator, Dc test circuits – Diodes ZR431 User Manual
Page 3
ZR431
ADJUSTABLE PRECISION ZENER SHUNT REGULATOR
ZR431
Document number: DS33255 Rev. 6 - 2
3 of 9
October 2011
© Diodes Incorporated
ADVAN
CE I
N
F
O
RM
ATI
O
N
DC Test Circuits
Fig. 1 Test Circuit for V
Z
= V
REF
Fig. 2 Test Circuit for V
Z
> V
REF
Fig.3 Test Circuit for Off State Current
Deviation of reference input voltage, V
DEV
, is defined as the maximum variation of the reference input voltage over the full
temperature range.
The average temperature coefficient of the reference input voltage, V
REF
is defined as:
)
2
T
1
T
(
V
1000000
V
)
C
/
ppm
(
V
ref
dev
o
ref
−
×
=
The dynamic output impedance, RZ is defined as:
z
z
z
I
V
R
Δ
Δ
=
When the device is programmed with two external resistors,
R1 and R2, (Fig 2), the dynamic output impedance of the
overall circuit, R’, is defined as:
)
2
R
1
R
1
(
R
R
z
+
=
′
Input
I
L
I
REF
I
Z
V
Z
V
REF
Input
I
L
I
REF
I
Z
V
Z
V
REF
R1
R2
Input
I
ZOFF
V
Z
T1
T2
Temperature
V
= V
- V
DEV
MAX
MIN
V
MAX
V
MIN