Electrical characteristics, Test conditions – Diodes AP431_A User Manual
Page 4
AP431/AP431A
Document number: DS31002 Rev. 21 - 2
4 of 17
June 2013
© Diodes Incorporated
AP431/AP431A
Electrical Characteristics
(cont.) (@T
A
= +25°C, V
DD
= 3V; unless otherwise specified.)
V
= V
- V
DEV
MAX
MIN
V
MAX
V
MIN
T1
T2
Temperature
Note: 6. Deviation of reference input voltage, V
DEV
, is defined as the maximum variation of the reference over the full temperature range.
The average temperature coefficient of the reference input voltage
V
REF
is defined as:
1
2
6
REF
DEV
REF
T
T
10
)
C)
(25
V
V
(
V
α
……………………..………..…………….. (
)
C
ppm
Where:
T2 – T1 = full temperature change.
V
REF
can be positive or negative depending on whether the slope is positive or negative.
Note: 7. The dynamic output impedance, R
Z
, is defined as:
KA
KA
KA
I
V
Z
When the device is programmed with two external resistors R1 and R2 (see Figure 2.), the dynamic output impedance of the overall
circuit, is defined as:
)
R2
R1
(1
Z
i
v
Z
KA
'
KA
≈
Test Conditions
Input
V
REF
V
KA
I
KA
Figure. 1 Test Circuit for V
= V
KA
REF
IN
R1
R2
Note: V
= V
(1 + R1/R2) + I
xR1
Figure. 2 Test Circuit for V
> V
KA
REF
REF
KA
REF
V
KA
I
KA
V
REF
I
REF
I
Z(OFF)
Figure. 3 Test Circuit for Off-State Current
IN
V
KA