Diodes DMN5L06WK - Manual (Page 2)

DMN5L06WK
Document number: DS30928 Rev. 8 - 2
2 of 6
www.diodes.com
March 2014
© Diodes Incorporated
DMN5L06WK
Maximum Ratings
(@T
A
= +25°C, unless otherwise specified.)
Characteristic Symbol Value Unit
Drain Source Voltage V
DSS
50 V
Gate-Source Voltage V
GSS
20 V
Drain Current (Note 5) Continuous
Pulsed (Note 6)
I
D
300
800
mA
Thermal Characteristics
(@T
A
= +25°C, unless otherwise specified.)
Characteristic Symbol Value Unit
Total Power Dissipation (Note 5) P
D
250 mW
Thermal Resistance, Junction to Ambient R
θJA
500 C/W
Operating and Storage Temperature Range T
J
, T
STG
-65 to +150 C
Electrical Characteristics
(@T
A
= +25°C, unless otherwise specified.)
Characteristic Symbol Min Typ Max Unit Test Condition
OFF CHARACTERISTICS (Note 7)
Drain-Source Breakdown Voltage
BV
DSS
50   V V
GS
= 0V, I
D
= 10μA
Zero Gate Voltage Drain Current @T
C
= +25°C I
DSS
  60 nA V
DS
= 50V, V
GS
= 0V
Gate-Body Leakage I
GSS
 
1
500
50
μA
nA
nA V
GS
= ±12V, V
DS
= 0V
V
GS
= ±10V, V
DS
= 0V
V
GS
= ±5V, V
DS
= 0V
ON CHARACTERISTICS (Note 7)
Gate Threshold Voltage
V
GS(th)
0.49  1.0 V V
DS
= V
GS
, I
D
= 250μA
Static Drain-Source On-Resistance R
DS (ON)


 

 3.0
2.5
2.0
Ω
V
GS
= 1.8V, I
D
= 50mA
V
GS
= 2.5V, I
D
= 50mA
V
GS
= 5.0V, I
D
= 50mA
On-State Drain Current I
D(ON)
0.5 1.4  A V
GS
= 10V, V
DS
= 7.5V
Forward Transconductance |Y
fs
| 200   mS V
DS
=10V, I
D
= 0.2A
Source-Drain Diode Forward Voltage V
SD
0.5  1.4 V V
GS
= 0V, I
S
= 115mA
DYNAMIC CHARACTERISTICS (Note 8)
Input Capacitance
C
iss
  50 pF
V
DS
= 25V, V
GS
= 0V
f = 1.0MHz
Output Capacitance C
oss
  25 pF
Reverse Transfer Capacitance C
rss
  5.0 pF
Turn-On Delay Time t
D(on)
 2.1  ns
V
DD
= 30V, V
GS
= 10V,
R
G
= 25Ω, I
D
= 200mA
Turn-On Rise Time t
r
 1.8  ns
Turn-Off Delay Time t
D(off)
 14.4  ns
Turn-Off Fall Time t
f
 8.4  ns
Notes: 5. Device mounted on FR-4 PCB.
6. Pulse width 10μS, Duty Cycle 1%.
7. Short duration pulse test used to minimize self-heating effect.
8. Guaranteed by design. Not subject to production testing.