ETS-Lindgren 95242-1 Injection Probes - Manual (Page 17)

4.0 Application
The principal use of the Bulk Current Injection Probe (BCIP) is for inducing
relatively large RF currents into the signal and power circuits of equipment under
test for conducted susceptibility. A secondary application would be to use the
same probe in a more familiar role as a sensor for measuring weak conducted
RF currents.
Conducted Susceptibility
Conducted susceptibility testing is intended to ensure that RF signals, when
coupled on to interconnecting cables and power supply lines of a device under
test (DUT), will not cause malfunction or degradation of performance. In addition,
this testing can provide an amplitude vs. frequency malfunction signature for the
system which, when compared with the levels of current on the cables in a typical
operating environment, can assist in the determination of adequate safety
margins.
T YPICAL T EST S ETUP
Typical conducted susceptibility tests require that all power and interconnecting
cables be tested by subjecting them to the required current or voltage levels,
while monitoring the applied current using a current probe. Usually, a reference
level calibration is performed using a calibration jig with a specified impedance.
This reference curve is then replayed to expose the DUT to a controlled stress
level, while a current probe is used to ensure that a low impedance DUT is not
overstressed.
Some tests may allow the reference calibration to be performed at a
lower level and then scaled up to the required power level when
applied to the DUT.
Entire cables or cable bundles may be tested, or each line may be broken out
and tested individually. Some standards may also require simultaneous injection
onto multiple cable bundles using several injection probes. Absorbing clamps
may be required to isolate peripheral equipment from the DUT, and ensure that
only the DUT is exposed to the required stress level. See the pertinent test
standard for more details.
Application | 17