Figure3.7 rise and fall time test conditions, Rise and fall time test conditions – Avago Technologies LSI53C180 User Manual
Page 48

3-14
Specifications
Figure 3.7
Rise and Fall Time Test Conditions
t
F
Fall time, 90% to 10%
4.0
18.5
ns
dV
H
/dt
Slew rate, LOW to HIGH
0.15
0.50
V/ns
dV
L
/dt
Slew rate, HIGH to LOW
0.15
0.50
V/ns
ESD
Electrostatic discharge
2
–
kV
MIL-STD-883C;
3015-7
Latch-up
100
–
mA
–
Filter delay
20
30
ns
Ultra filter delay
10
15
ns
Ultra3 filter delay
x
x
ns
Extended filter delay
40
60
ns
1. These values are guaranteed by periodic characterization; they are not 100% tested on every device.
2. Active negation outputs only: Data, Parity, SREQ/, SACK/. (Minus Pins) SCSI mode only.
3. Single pin only; irreversible damage may occur if sustained for one second.
4. SCSI RESET pin has 10 k
Ω
pull-up resistor.
Table 3.15
TolerANT Technology Electrical Characteristics
1
(Cont.)
Symbol
Parameter
Min
Max
Units
Test Conditions
(Sheet 2 of 2)
20 pF
47
Ω
2.5 V
+
−