VEGA VEGATOR 636 Ex User Manual

Page 18

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18

6 Setup

VEGATOR 636 Ex • Signal conditioning instrument

45508-EN-130627

Switch

1

2

3

4

5

6

14 s

A/B

on

off

on

18 s

A/B

off

on

on

20 s

A/B

on

on

on

The measuring system is continuously monitored. The following

criteria are checked:

Two-wire cable on line break and shortcircuit

Interruption of the connection cable to the piezo elements

Corrosion or damage of the tuning fork (vibrating rod)

Break of the tuning fork (vibrating rod)

Loss of vibration

Too low vibrating frequency

Medium penetrating from the vessel side into the sensor

In systems with VEGASWING or VEGAVIB level switches in conjunc-

tion with a two-wire electronics module, a function test can be carried

out. VEGATOR 636 Ex has an integrated test key. The test key is

recessed in the front plate of the signal conditioning instrument. Push

the test key with a suitable object (e.g. screwdriver, pen etc.).
By pushing the key, the system is checked on the following criteria:

Switching function of the switching outputs

Potential separation of the outputs

The signal processing of the signal conditioning instrument

After pushing the test key, the complete measuring system is checked

on correct function. The following operating conditions are simulated

during the test:

Fault message

Empty signal

Full signal

Check if all three switching conditions occur in the correct sequence

and the stated duration. If not, there is a fault in the measuring system

(see chapter "Fault rectification").
Note:

Keep in mind that the connected instruments are activated during the

function test. By doing this, you can check the correct function of the

measuring system.

After releasing the key.
The specified times apply with a tolerance of ±20 %.

A-mode

B-mode

1 Simulation of a fault signal (approx. 3 s)
Level relay deenergised

Relay control lamp off

Relay control lamp off

1 Simulation of a fault signal
Failure lamp

Failure lamp lights

Failure lamp lights

Function monitoring

Test key

Test procedure

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