5 program and erase characteristics, 6 power-up conditions, 7 input test waveforms and measurement levels – Rainbow Electronics AT25DF041A User Manual
Page 33: 8 output test load
33
3668E–DFLASH–11/2012
AT25DF041A
Note:
1. Maximum values indicate worst-case performance after 100,000 erase/program cycles.
2. Not 100% tested (value guaranteed by design and characterization).
12.7
Input Test Waveforms and Measurement Levels
t
R
, t
F
< 2 ns (10% to 90%)
12.8
Output Test Load
12.5
Program and Erase Characteristics
Symbol
Parameter
Min
Typ
Max
Units
t
PP
Page Program Time (256 Bytes)
1.2
5
ms
t
BP
Byte Program Time
7
µs
t
BLKE
Block Erase Time
4 Kbytes
50
200
ms
32 Kbytes
250
600
64 Kbytes
400
950
t
CHPE
Chip Erase Time
3
7
sec
t
WRSR
Write Status Register Time
200
ns
12.6
Power-up Conditions
Symbol
Parameter
Min
Max
Units
t
VCSL
Minimum V
CC
to Chip Select Low Time
70
µs
t
PUW
Power-up Device Delay Before Program or Erase Allowed
10
ms
V
POR
Power-on Reset Voltage
1.5
2.2
V
AC
DRIVING
LEVELS
AC
MEASUREMENT
LEVEL
0.45V
1.5V
2.4V
DEVICE
UNDER
TEST
30 pF